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[HTML][HTML] A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee, J Wang - The Journal of Chemical …, 2020 - pubs.aip.org
The General AMBER Force Field (GAFF) has been broadly used by researchers all over the
world to perform in silico simulations and modelings on diverse scientific topics, especially in …
被引用次数：287 相关文章

[引用][C] A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee, J Wang - The Journal of Chemical …, 2020 - par.nsf.gov

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee, J Wang - The Journal of Chemical …, 2020 - cir.nii.ac.jp
抄録< jats: p> The General AMBER Force Field (GAFF) has been broadly used by
researchers all over the world to perform in silico simulations and modelings on diverse …

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee… - Journal of Chemical …, 2020 - ui.adsabs.harvard.edu
Abstract The General AMBER Force Field (GAFF) has been broadly used by researchers all
over the world to perform in silico simulations and modelings on diverse scientific topics …

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee… - Journal of …, 2020 - utsouthwestern.elsevierpure.com
Abstract The General AMBER Force Field (GAFF) has been broadly used by researchers all
over the world to perform in silico simulations and modelings on diverse scientific topics …

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee, J Wang - The Journal of Chemical …, 2020 - pubs.aip.org
ABSTRACT The General AMBER Force Field (GAFF) has been broadly used by researchers
all over the world to perform in silico simulations and modelings on diverse scientific topics …

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee… - The Journal of …, 2020 - pubmed.ncbi.nlm.nih.gov
The General AMBER Force Field (GAFF) has been broadly used by researchers all over the
world to perform in silico simulations and modelings on diverse scientific topics, especially in …

A fast and high-quality charge model for the next generation general AMBER force field.

X He, VH Man, W Yang, TS Lee… - The Journal of Chemical …, 2020 - europepmc.org
Abstract The General AMBER Force Field (GAFF) has been broadly used by researchers all
over the world to perform in silico simulations and modelings on diverse scientific topics …
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[HTML][HTML] A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee… - The Journal of Chemical …, 2020 - ncbi.nlm.nih.gov
Abstract The General AMBER Force Field (GAFF) has been broadly used by researchers all
over the world to perform in silico simulations and modelings on diverse scientific topics …

A fast and high-quality charge model for the next generation general AMBER force field

X He, VH Man, W Yang, TS Lee… - Journal of Chemical …, 2020 - researchwithrutgers.com
Abstract The General AMBER Force Field (GAFF) has been broadly used by researchers all
over the world to perform in silico simulations and modelings on diverse scientific topics …