Binary group III-nitride based heterostructures: band offsets and transport properties
In the last few years, there has been remarkable progress in the development of group III-
nitride based materials because of their potential application in fabricating various …
nitride based materials because of their potential application in fabricating various …
A novel AlGaN/GaN based enhancement-mode high electron mobility transistor with sub-critical barrier thickness
R Brown - 2015 - theses.gla.ac.uk
Power-switching devices require low on-state conduction losses, high-switching speed, high
thermal stability, and high input impedance. Using gallium nitride (GaN) based field-effect …
thermal stability, and high input impedance. Using gallium nitride (GaN) based field-effect …
Novel high-current density GaN-based normally off transistor with tensile-strained quaternary InAlGaN barrier
R Kajitani, K Tanaka, M Ogawa, H Ishida… - Japanese Journal of …, 2015 - iopscience.iop.org
A GaN-based normally off heterostructure field effect transistor (HFET) with high current
density and with a quaternary InAlGaN barrier instead of an AlGaN barrier is investigated. It …
density and with a quaternary InAlGaN barrier instead of an AlGaN barrier is investigated. It …
A new process approach for slant field plates in GaN-based high-electron-mobility transistors
T Suemitsu, K Kobayashi, S Hatakeyama… - Japanese Journal of …, 2015 - iopscience.iop.org
A new process approach to realize a slant field plate—a field plate (FP) gradually separated
from the semiconductor surface from the gate edge toward the drain—is reported. A …
from the semiconductor surface from the gate edge toward the drain—is reported. A …
Single-crystalline semipolar GaN on Si (001) using a directional sputtered AlN intermediate layer
We obtained single-crystalline semipolar (10 1¯ 3) GaN on a nominal Si (001) substrate with
sputtered AlN using the directional feature of sputtering. One dominated orientation of AlN …
sputtered AlN using the directional feature of sputtering. One dominated orientation of AlN …
III-Nitride nanostructures for UV emitters
C Himwas - 2015 - theses.hal.science
This work reports on the design, epitaxial growth, and the structural, and optical
characterization of two types of nanostructures, namely AlGaN/AlN Stranski-Krastanov …
characterization of two types of nanostructures, namely AlGaN/AlN Stranski-Krastanov …
Modelling of GaN power switches
S Jogi - 2015 - rave.ohiolink.edu
The main goal of this work was to develop the necessary expertise and model various
parameters and characteristics of gallium nitride power HEMT (High Electron Mobility …
parameters and characteristics of gallium nitride power HEMT (High Electron Mobility …
[图书][B] Characterization of Al (Ga, In) N nanowire heterostructures and applications in light emitting diodes
A Connie - 2015 - search.proquest.com
One of the main advantages of nanowire structures is its ability to grow dislocation-free
crystal on a foreign substrate, which has been the major bottleneck for III-nitride planar …
crystal on a foreign substrate, which has been the major bottleneck for III-nitride planar …
二次元原子薄膜の材料物性とデバイス特性を繋ぐ高輝度放射光オペランド顕微分光
吹留博一 - 表面科学, 2015 - jstage.jst.go.jp
抄録 Si-based electronics has reached an ultimate fabrication level (22 nm design rule),
which makes further progress hardly achieved. Therefore, 2D atomic layers including …
which makes further progress hardly achieved. Therefore, 2D atomic layers including …