Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan–Meier estimation
Most of the reported prognostic techniques use a small number of condition indicators
and/or use a thresholding strategies in order to predict the remaining useful life (RUL). In this …
and/or use a thresholding strategies in order to predict the remaining useful life (RUL). In this …
Intelligent maintenance prediction system for LED wafer testing machine
CC Hsu, MS Chen - Journal of Intelligent Manufacturing, 2016 - Springer
Achieving high quality production of light-emitting diode (LED) wafers requires robust
monitoring and the use of a stable test machine. In many factories, production continues 24 …
monitoring and the use of a stable test machine. In many factories, production continues 24 …