Comparing the reliability and intermetallic layer of solder joints prepared with infrared and vapour phase soldering

O Krammer - Soldering & Surface Mount Technology, 2014 - emerald.com
Purpose–The purpose of this paper is to compare the reliability and intermetallic layer (IML)
of solder joints prepared with infrared (IR) and vapour phase (VP) soldering. The reliability of …

Cross-scale numerical analysis of PCB lamination process by an innovative partitioned homogenization method for the non-uniform curing shrinkage effect

G Wan, Q Dong, X Sun, H Zheng, M Cheng… - Microelectronics …, 2024 - Elsevier
This study introduces a cross-scale numerical analysis approach for modeling the
lamination process and predicting the post-lamination warping deformation of Printed Circuit …

Warpage simulation of a multilayer printed circuit board and microelectronic package using the anisotropic viscoelastic shell modeling technique that considers the …

DH Kim, SJ Joo, DO Kwak… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
In this paper, the warpage simulation of a high-density multilayer printed circuit board (PCB)
for solid-state disk drive (SSD) and microelectronic package was performed using the …

Solder reflow process induced residual warpage measurement and its influence on reliability of flip-chip electronic packages

SY Yang, YD Jeon, SB Lee, KW Paik - Microelectronics Reliability, 2006 - Elsevier
To meet the future needs of high pin count and high performance, package size of flip-chip
devices is constrained to become larger. In addition, to fulfill the environment issues, lead …

Simulation and optimization of silicon thermal CVD through CFD integrating Taguchi method

WT Cheng, HC Li, CN Huang - Chemical Engineering Journal, 2008 - Elsevier
A steady laminar flow coupled with heat transfer, gas-phase chemistry, and surface
chemistry model, was numerically solved for optimization of thermal chemical vapor …

New dummy design and stiffener on warpage reduction in Ball Grid Array Printed Circuit Board

S Cho, TE Chang, JY Lee, HP Park, Y Ko… - Microelectronics …, 2010 - Elsevier
Printed Circuit Board (PCB) warpage increases as thickness decreases and ultimately is
attributed to CTE mismatch and thickness geometry of the components. Recently, a thin Ball …

Investigating the mechanical strength of vapor phase soldered chip components joints

O Krammer, T Garami - 2010 IEEE 16th International …, 2010 - ieeexplore.ieee.org
In our experiment the mechanical strength of solder joints formed by Vapor Phase soldering
was investigated. A testboard was designed, which allowed fifty pieces of 0603 size chip …

Reliability Characteristics of a Package-on-Package with Temperature/Humidity Test, Temperature Cycling Test, and High Temperature Storage Test

D Park, TS Oh - Journal of the Microelectronics and Packaging …, 2016 - koreascience.kr
Reliability characteristics of thin package-on-packages were evaluated using T/H
(temperature/humidity) test at $85^{\circ} C/85% $ for 500 hours, TC (temperature cycling) …

Comparing the intermetallic layer formation of Infrared and Vapour Phase soldering

O Krammer, T Garami - … of the 2011 34th International Spring …, 2011 - ieeexplore.ieee.org
In our experiment the intermetallic layer (IML) formation during Infrared (IR) and Vapour
Phase (VP) soldering was investigated. A testboard was designed, onto which fifty pieces of …

Experimental and statistical study in adhesion features of bonded interfaces of IC packages

CH Chien, T Chen, WB Lin, CC Hsieh, YD Wu… - Microelectronics …, 2008 - Elsevier
The existence of defects in the corresponding interfaces can gradually degrade the
interfacial adhesion when the flip chip package is exposed to the high temperature and …