[图书][B] Electronic design automation: synthesis, verification, and test
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …
practitioners and researchers in need of fluency in an" adjacent" field will find this an …
Analysis of cyclic combinational circuits
S Malik - IEEE Transactions on Computer-Aided Design of …, 1994 - ieeexplore.ieee.org
A logic circuit is said to be combinational if the function it computes depends only on the
inputs applied to the circuit, and is sequential if it depends on some past history in addition …
inputs applied to the circuit, and is sequential if it depends on some past history in addition …
Single-rail handshake circuits
A Peeters, K van Berkel - Proceedings Second Working …, 1995 - ieeexplore.ieee.org
Single-rail handshake circuits are introduced as a cost effective implementation of
asynchronous circuits. Compared to double-rail implementations, the circuits are smaller …
asynchronous circuits. Compared to double-rail implementations, the circuits are smaller …
False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation
We propose a false-path-aware statistical timing analysis framework. In our framework, cell
as well as interconnect delays are assumed to be correlated random variables. Our tool can …
as well as interconnect delays are assumed to be correlated random variables. Our tool can …
Classification and identification of nonrobust untestable path delay faults
KT Cheng, HC Chen - … on Computer-Aided Design of Integrated …, 1996 - ieeexplore.ieee.org
Recently published results have shown that, for many circuits, only a small percentage of
path delay faults is robust testable, Among the robust untestable faults, a significant …
path delay faults is robust testable, Among the robust untestable faults, a significant …
Bandwidth bandit: Quantitative characterization of memory contention
D Eklov, N Nikoleris, D Black-Schaffer… - Proceedings of the 21st …, 2012 - dl.acm.org
Applications that are co-scheduled on a multi-core compete for shared resources, such as
cache capacity and memory bandwidth. The performance degradation resulting from this …
cache capacity and memory bandwidth. The performance degradation resulting from this …
Perturb and simplify: Multilevel boolean network optimizer
SC Chang, M Marek-Sadowska… - IEEE Transactions on …, 1996 - ieeexplore.ieee.org
In this paper, we present logic optimization techniques for multilevel combinational
networks. Our techniques apply a sequence of perturbations which result in simplification of …
networks. Our techniques apply a sequence of perturbations which result in simplification of …
Delay testing for non-robust untestable circuits
KT Cheng, HC Chen - Proceedings of IEEE International Test …, 1993 - ieeexplore.ieee.org
Recently published results have shown that, for many circuits, only a small percentage of
path delay faults is robust testable. Among the robust untestable faults, a significant …
path delay faults is robust testable. Among the robust untestable faults, a significant …
Head pose-free appearance-based gaze sensing via eye image synthesis
This paper addresses the problem of estimating human gaze from eye appearance under
free head motion. Allowing head motion remains challenging because eye appearance …
free head motion. Allowing head motion remains challenging because eye appearance …
A pruning and feedback strategy for locating reliability-critical gates in combinational circuits
J Xiao, W Zhu, Q Shen, H Long… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
In nanometric integrated circuits, to harden reliability-critical gates (RCGs) is an important
step to improve overall circuit reliability at a low cost. To locate RCGs quickly and efficiently …
step to improve overall circuit reliability at a low cost. To locate RCGs quickly and efficiently …