[HTML][HTML] State of the art and future perspectives in advanced CMOS technology

HH Radamson, H Zhu, Z Wu, X He, H Lin, J Liu… - Nanomaterials, 2020 - mdpi.com
The international technology roadmap of semiconductors (ITRS) is approaching the
historical end point and we observe that the semiconductor industry is driving …

[HTML][HTML] Miniaturization of CMOS

HH Radamson, X He, Q Zhang, J Liu, H Cui, J Xiang… - Micromachines, 2019 - mdpi.com
When the international technology roadmap of semiconductors (ITRS) started almost five
decades ago, the metal oxide effect transistor (MOSFET) as units in integrated circuits (IC) …

Vertically stacked gate-all-around Si nanowire CMOS transistors with dual work function metal gates

H Mertens, R Ritzenthaler, A Chasin… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
We report on the CMOS integration of vertically stacked gate-all-around (GAA) silicon
nanowire MOSFETs, with matched threshold voltages (V t, sat~ 0.35 V) for N-and P-type …

Nanowire & nanosheet FETs for ultra-scaled, high-density logic and memory applications

A Veloso, T Huynh-Bao, P Matagne, D Jang… - Solid-State …, 2020 - Elsevier
We report on vertically stacked lateral nanowires (NW)/nanosheets (NS) gate-all-around
(GAA) FET devices as promising candidates to obtain a better power-performance metric for …

Demonstration of germanium vertical gate-all-around field-effect transistors featured by self-aligned high-κ metal gates with record high performance

L Xie, H Zhu, Y Zhang, X Ai, J Li, G Wang, J Liu, A Du… - ACS …, 2023 - ACS Publications
A special Ge nanowire/nanosheet (NW/NS) p-type vertical sandwich gate-all-around (GAA)
field-effect transistor (FET)(Ge NW/NS pVSAFET) with self-aligned high-κ metal gates …

Simulation of the effect of parasitic channel height on characteristics of stacked gate-all-around nanosheet FET

Y Choi, K Lee, KY Kim, S Kim, J Lee, R Lee… - Solid-State …, 2020 - Elsevier
By using technology computer aided design (TCAD) simulation, the aim of this paper is to
investigate the effect of Si parasitic channel, which is placed under stacked nanosheet …

Stacked Ge-nanosheet GAAFETs fabricated by Ge/Si multilayer epitaxy

CL Chu, K Wu, GL Luo, BY Chen… - IEEE Electron …, 2018 - ieeexplore.ieee.org
Horizontally stacked Ge-nanosheet gate-all-around FETs (GAAFETs) are demonstrated for
the first time. The Ge/Si multilayers instead of the typically used Ge/SiGe ones were …

[HTML][HTML] Strain engineering in functional materials

G Tsutsui, S Mochizuki, N Loubet, SW Bedell… - AIP Advances, 2019 - pubs.aip.org
Silicon based complementary metal-oxide-semiconductor field-effect-transistor (CMOSFET)
technology has continued to progress unabated for last five decades despite various …

Novel GAA Si nanowire p-MOSFETs with excellent short-channel effect immunity via an advanced forming process

Q Zhang, H Yin, L Meng, J Yao, J Li… - IEEE Electron …, 2018 - ieeexplore.ieee.org
In this letter, Gate-All-Around (GAA) nanowire (NW) p-MOSFETs with new approaches to
fabricate totally isolated channels in replacement metal gate (RMG) are reported for the first …

[HTML][HTML] Four-period vertically stacked SiGe/Si channel FinFET fabrication and its electrical characteristics

Y Li, F Zhao, X Cheng, H Liu, Y Zan, J Li, Q Zhang… - Nanomaterials, 2021 - mdpi.com
In this paper, to solve the epitaxial thickness limit and the high interface trap density of SiGe
channel Fin field effect transistor (FinFET), a four-period vertically stacked SiGe/Si channel …