Towards complete recovery of circuit degradation by annealing with on-chip heaters
J Diaz-Fortuny, P Saraza-Canflanca… - IEEE Electron …, 2022 - ieeexplore.ieee.org
This work reports an on-chip heater structure fabricated in the Front End of Line (FEOL) on a
versatile ring-oscillator (RO) array utilized to conduct statistical characterization of on-chip …
versatile ring-oscillator (RO) array utilized to conduct statistical characterization of on-chip …
Reliability evaluation of ic ring oscillator pufs
Silicon-based Physical Unclonable Functions (PUFs) have become a popular solution to
provide security in many applications. PUFs are circuits that take advantage of the innate …
provide security in many applications. PUFs are circuits that take advantage of the innate …
Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications
J Diaz-Fortuny, P Saraza-Canflanca… - 2022 IEEE Latin …, 2022 - ieeexplore.ieee.org
With today's rapid development of novel and advanced technology nodes, transistor
degradation phenomena like BTI and HCI are evolving to an even more serious concern for …
degradation phenomena like BTI and HCI are evolving to an even more serious concern for …
A Test Module for Aging Characterization of Digital Circuits
JM Gata-Romero, A Santana-Andreo… - … and Applications to …, 2023 - ieeexplore.ieee.org
In digital circuits, aging phenomena can lead to timing violations due to increased signal
delays suffered by digital cells. An accurate and trustworthy characterization of these …
delays suffered by digital cells. An accurate and trustworthy characterization of these …
Characterization and analysis of BTI and HCI effects in CMOS current mirrors
A Santana-Andreo, P Martín-Lloret… - … and Applications to …, 2022 - ieeexplore.ieee.org
This paper presents experimental results on the aging-induced degradation of CMOS
current mirrors fabricated in a 65-nm CMOS technology. A dedicated integrated circuit array …
current mirrors fabricated in a 65-nm CMOS technology. A dedicated integrated circuit array …
Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures
A Santana-Andreo, P Martin-Lloret… - 2022 IEEE 34th …, 2022 - ieeexplore.ieee.org
This work presents an integrated circuit array with custom test structures for the
characterization of aging phenomena that includes three types of commonly-used circuits …
characterization of aging phenomena that includes three types of commonly-used circuits …