This paper presents a CMOS RF amplitude detector as a practical integrated test device and
demonstrates its application for on-chip testing. The proposed circuit performs full-wave …

Due to the lack of widely applicable fault models, testing for analog, mixedsignal (AMS), and
radio frequency (RF) circuits has been, and will continue to be, primarily based on checking …

A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules
(IP. i), a storage circuit (110) operable to hold a table representing sets of compatible tests …

This paper proposes and describes a new software and application programming interface
view of an RF transceiver. It demonstrates benefits of using highly programmable digital …

A novel approach for mitigation of self-interference in highly-integrated wireless transceivers
is presented. Several examples of possible applications of this approach in a wireless …

A novel technique for mitigation of self interference in a highly integrated SoC transmitter is
presented. The interference originates from the internal power amplifier (ie, aggressor) that …

This paper describes the theory and chip measurements of a built-in test technique for RF
receivers which uses simple RF amplitude detectors. The method has been used to …

Structural approach for built-in tests in RF devices Page 1 Structural Approach for Built-in Tests
In RF Devices Deepa Mannath, Dallas Webster, Victor Montano-Martinez, David Cohen, Shai …

A programmable self-characterization technique is presented, whose purpose is to
determine the extent of mismatches present in a variable-capacitor (varactor) array as part of …

Digital RF solutions have been shown to be advantageous in various design aspects, such
as accurate modeling, design reuse, and scaling when migrating to the next CMOS process …