Chemical mechanical planarization for microelectronics applications
PB Zantye, A Kumar, AK Sikder - Materials Science and Engineering: R …, 2004 - Elsevier
The progressively decreasing feature size of the circuit components has tremendously
increased the need for the global surface planarization of the various thin film layers that …
increased the need for the global surface planarization of the various thin film layers that …
Review on copper chemical–mechanical polishing (CMP) and post-CMP cleaning in ultra large system integrated (ULSI)—An electrochemical perspective
Y Ein-Eli, D Starosvetsky - Electrochimica Acta, 2007 - Elsevier
The current review describes electrochemical evaluation and study of copper chemical–
mechanical polishing (CMP) slurries and post-CMP cleaning solutions. Electrochemical and …
mechanical polishing (CMP) slurries and post-CMP cleaning solutions. Electrochemical and …
Experimental and theoretical investigation into surface roughness and residual stress in magnetorheological finishing of OFHC copper
Highly finished copper surface without any appreciable residual stress is in high demand in
electronics, space, and optical industries. Conventional finishing processes are not suitable …
electronics, space, and optical industries. Conventional finishing processes are not suitable …
Modification of the Preston equation for the chemical–mechanical polishing of copper
Q Luo, S Ramarajan, SV Babu - Thin solid films, 1998 - Elsevier
Chemical-mechanical polishing (CMP) of copper was conducted in two acidic (pH 1.3 and
3.8) slurries and one alkaline pH (10∼ 12) slurry with alumina particles as the abrasives. In …
3.8) slurries and one alkaline pH (10∼ 12) slurry with alumina particles as the abrasives. In …
Potential-pH diagrams of interest to chemical mechanical planarization of copper
S Tamilmani, W Huang, S Raghavan… - Journal of The …, 2002 - iopscience.iop.org
The chemical mechanical planarization (CMP) of copper-based structures is typically carried
out with slurries that contain an oxidant, a complexant, and a corrosion inhibitor. The …
out with slurries that contain an oxidant, a complexant, and a corrosion inhibitor. The …
Effect of glycine and hydrogen peroxide on chemical–mechanical planarization of copper
S Seal, SC Kuiry, B Heinmen - Thin solid films, 2003 - Elsevier
Chemical–mechanical planarization (CMP) of copper is a vital process to produce sub-
micron range and multilevel metallization to meet the demands of the current interconnect …
micron range and multilevel metallization to meet the demands of the current interconnect …
The role of glycine in the chemical mechanical planarization of copper
S Aksu, FM Doyle - Journal of the Electrochemical Society, 2002 - iopscience.iop.org
Chemical mechanical polishing (CMP) is an essential process in the production of
integrated circuits containing copper interconnects. The role of glycine in reactive slurries …
integrated circuits containing copper interconnects. The role of glycine in reactive slurries …
Synthesis of polishing fluid and novel approach for nanofinishing of copper using ball-end magnetorheological finishing process
Ball-end magnetorheological (MR) finishing process utilizes the magnetically controlled
stiffened ball of an MR fluid for finishing purposes. Copper is a mechanically soft and …
stiffened ball of an MR fluid for finishing purposes. Copper is a mechanically soft and …
Effect of hydrogen peroxide on oxidation of copper in CMP slurries containing glycine
S Aksu, L Wang, FM Doyle - Journal of The Electrochemical …, 2003 - iopscience.iop.org
This study compares the oxidative dissolution, passivation, and polishing behavior of copper
in chemical mechanical polishing (CMP) the presence of glycine when the potential was …
in chemical mechanical polishing (CMP) the presence of glycine when the potential was …
Mechanism of copper removal during CMP in acidic H 2 O 2 slurry
T Du, D Tamboli, V Desai, S Seal - Journal of the Electrochemical …, 2004 - iopscience.iop.org
Chemical mechanical polishing of copper was performed using as oxidizer and alumina
particles as abrasives. Electrochemical techniques were used to investigate the …
particles as abrasives. Electrochemical techniques were used to investigate the …