Chemical mechanical planarization for microelectronics applications

PB Zantye, A Kumar, AK Sikder - Materials Science and Engineering: R …, 2004 - Elsevier
The progressively decreasing feature size of the circuit components has tremendously
increased the need for the global surface planarization of the various thin film layers that …

Review on copper chemical–mechanical polishing (CMP) and post-CMP cleaning in ultra large system integrated (ULSI)—An electrochemical perspective

Y Ein-Eli, D Starosvetsky - Electrochimica Acta, 2007 - Elsevier
The current review describes electrochemical evaluation and study of copper chemical–
mechanical polishing (CMP) slurries and post-CMP cleaning solutions. Electrochemical and …

Experimental and theoretical investigation into surface roughness and residual stress in magnetorheological finishing of OFHC copper

G Ghosh, A Sidpara, PP Bandyopadhyay - Journal of materials processing …, 2021 - Elsevier
Highly finished copper surface without any appreciable residual stress is in high demand in
electronics, space, and optical industries. Conventional finishing processes are not suitable …

Modification of the Preston equation for the chemical–mechanical polishing of copper

Q Luo, S Ramarajan, SV Babu - Thin solid films, 1998 - Elsevier
Chemical-mechanical polishing (CMP) of copper was conducted in two acidic (pH 1.3 and
3.8) slurries and one alkaline pH (10∼ 12) slurry with alumina particles as the abrasives. In …

Potential-pH diagrams of interest to chemical mechanical planarization of copper

S Tamilmani, W Huang, S Raghavan… - Journal of The …, 2002 - iopscience.iop.org
The chemical mechanical planarization (CMP) of copper-based structures is typically carried
out with slurries that contain an oxidant, a complexant, and a corrosion inhibitor. The …

Effect of glycine and hydrogen peroxide on chemical–mechanical planarization of copper

S Seal, SC Kuiry, B Heinmen - Thin solid films, 2003 - Elsevier
Chemical–mechanical planarization (CMP) of copper is a vital process to produce sub-
micron range and multilevel metallization to meet the demands of the current interconnect …

The role of glycine in the chemical mechanical planarization of copper

S Aksu, FM Doyle - Journal of the Electrochemical Society, 2002 - iopscience.iop.org
Chemical mechanical polishing (CMP) is an essential process in the production of
integrated circuits containing copper interconnects. The role of glycine in reactive slurries …

Synthesis of polishing fluid and novel approach for nanofinishing of copper using ball-end magnetorheological finishing process

DA Khan, S Jha - Materials and Manufacturing Processes, 2018 - Taylor & Francis
Ball-end magnetorheological (MR) finishing process utilizes the magnetically controlled
stiffened ball of an MR fluid for finishing purposes. Copper is a mechanically soft and …

Effect of hydrogen peroxide on oxidation of copper in CMP slurries containing glycine

S Aksu, L Wang, FM Doyle - Journal of The Electrochemical …, 2003 - iopscience.iop.org
This study compares the oxidative dissolution, passivation, and polishing behavior of copper
in chemical mechanical polishing (CMP) the presence of glycine when the potential was …

Mechanism of copper removal during CMP in acidic H 2 O 2 slurry

T Du, D Tamboli, V Desai, S Seal - Journal of the Electrochemical …, 2004 - iopscience.iop.org
Chemical mechanical polishing of copper was performed using as oxidizer and alumina
particles as abrasives. Electrochemical techniques were used to investigate the …