Enabling Effective Error Mitigation in Memory Chips That Use On-Die Error-Correcting Codes
M Patel - arXiv preprint arXiv:2204.10387, 2022 - arxiv.org
Improvements in main memory storage density are primarily driven by process technology
scaling, which negatively impacts reliability by exacerbating various circuit-level error …
scaling, which negatively impacts reliability by exacerbating various circuit-level error …