5.59 W/mm at 30 GHz from E-mode AlN/GaN HEMT using selective etch of in-situ SiN passivation layer

P Wang, M Mi, S An, Y Zhou, Z Chen… - IEEE Electron …, 2024 - ieeexplore.ieee.org
This work reports on high-performance enhancement-mode (E-mode) AlN/GaN Schottky
gate HEMT (AlN SGHEMT) for millimeter-wave applications. Utilizing an ultrathin 4-nm …

Nuclear transparency of the charged hadrons produced in the electronuclear reaction

S Das - Physical Review C, 2022 - APS
The nuclear transparency of charged hadrons produced in the (e, e′) reaction on nuclei
has been calculated using the Glauber model for the nuclear reaction. The color …

Strain‐Engineered Unified SiNx Deposition for Device Passivation and Capacitance Dielectric in GaN Monolithic Microwave Integrated Circuit

J Sahu, B Parvez, M Patil, R SJ, A Sahu… - … status solidi (a), 2024 - Wiley Online Library
Silicon nitride (SiNx) is used for device passivation and capacitance dielectric in GaN
monolithic microwave integrated circuits. However, this is a conflicting requirement as …

Process-induced stress tuning to improve linearity performance in AlGaN/GaN HEMTs with SiNx passivation

D Jena, S Das, CJ Praharaj, A Tripathy, T Dash - Physica Scripta, 2024 - iopscience.iop.org
Strain engineering has proven to be a useful technique for enhancing the performance of
many modern-day transistors. Stress engineering can also have a non-trivial effect on the …

Design and Simulation of Enhancement-Mode Vertical Superjunction GaN HEMT with Improved Ron and Cut-Off Frequency

D Jena, S Das, T Dash - IETE Journal of Research, 2024 - Taylor & Francis
GaN-based vertical superjunction high electron mobility transistors (HEMT) are recent
avenues for power transistors. In this work, an enhancement mode vertical superjunction …

Strain Engineering for Highly Scaled MOSFETs

CK Maiti, T Dash, J Jena… - … : Current Trends and …, 2024 - Wiley Online Library
The advent of novel materials for manufacturing and the inherent constraints of nanoscale
devices, which lead to an increase in the unpredictability of device characteristics, pose …

Effect of Nitride Stress on Linearity performance of AlGaN/GaN HEMT

D Jena, S Das, E Mohapatra… - 2022 IEEE International …, 2022 - ieeexplore.ieee.org
Strain engineering has proved to be useful for enhancing the performance of AlGaN/GaN
HEMT devices. The device transfer characteristics are significantly affected by proper …

Comparative Study of AlGaN/GaN-Based Polarization Junction Super HFET

D Jena, S Das, A Tripathy… - 2023 1st International …, 2023 - ieeexplore.ieee.org
The double-hetero GaN/AlGaN/GaN polarization junction (PJ) is a semiconductor structure
designed to enhance the performance of RF (Radio Frequency) and power devices …