[HTML][HTML] From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction

F La Via, A Severino, R Anzalone, C Bongiorno… - Materials Science in …, 2018 - Elsevier
In this review the effect of the growth process on the formation of defects in the hetero-
epitaxial 3C-SiC film and the possible path for defects reduction has been reported. In our …

Formation of annealing twins in fcc crystals

S Mahajan, CS Pande, MA Imam, BB Rath - Acta materialia, 1997 - Elsevier
A microscopic model for the formation of annealing twins in fcc crystals is proposed. It is
argued that Shockley partial loops nucleate on consecutive {111} planes by growth …

[图书][B] Metalorganic vapor phase epitaxy (MOVPE): Growth, materials properties, and applications

S Irvine, P Capper - 2019 - books.google.com
Systematically discusses the growth method, material properties, and applications for key
semiconductor materials MOVPE is a chemical vapor deposition technique that produces …

Nucleation and void formation mechanisms in SiC thin film growth on Si by carbonization

JP Li, AJ Steckl - Journal of the Electrochemical Society, 1995 - iopscience.iop.org
The nucleation mechanisms for SiC thin films on Si were investigated by interrupting the
growth at very brief times (-i to i0 s) using rapid thermal chemical vapor deposition in …

The growth of strained Si1− xGex alloys on< 001> silicon using solid phase epitaxy

DC Paine, DJ Howard, NG Stoffel… - Journal of Materials …, 1990 - cambridge.org
In this paper we report on the growth of pseudomorphically strained Si1− xGex alloys on<
001> Si by solid phase epitaxy. One set of amorphous alloys was formed by high dose ion …

Mid-infrared type-II InAs/InAsSb quantum wells integrated on silicon

E Delli, PD Hodgson, M Bentley, E Repiso… - Applied Physics …, 2020 - pubs.aip.org
Direct integration of III–V semiconductor light sources on silicon is an essential step toward
the development of portable, on-chip infrared sensor systems. Driven by the presence of …

Microstructural characterization of semipolar GaN templates and epitaxial-lateral-overgrown films deposited on m-plane sapphire by metalorganic vapor phase …

P Vennegues, Z Bougrioua… - Japanese Journal of …, 2007 - iopscience.iop.org
The microstructure of GaN templates and epitaxial lateral overgrown (ELO) films deposited
on M-plane sapphire is investigated by transmission electron microscopy. The epitaxial …

Structural characterization of nanometer SiC films grown on Si

JP Li, AJ Steckl, I Golecki, F Reidinger, L Wang… - Applied physics …, 1993 - pubs.aip.org
Continuous, ultrathin silicon carbide (SiC) films of less than 10 nm have been grown on Si
by rapid thermal chemical vapor deposition carbonization with high propane flow rates at …

Influence of the interface composition of InAs/AlSb superlattices on their optical and structural properties

J Spitzer, A Höpner, M Kuball, M Cardona… - Journal of applied …, 1995 - pubs.aip.org
A series of five short-period (InAs) &4lSb), superlattices, grown either with ALAS-like, InSb-
like, or alternating interfaces, were studied by means of x-ray diffraction, high resolution …

Defect structure in heteroepitaxial semipolar ()(Ga, Al) N

YAR Dasilva, MP Chauvat, P Ruterana… - Journal of Physics …, 2010 - iopscience.iop.org
The defect structures in semipolar ()-GaN, AlN layers grown on m-sapphire by metal organic
vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) are characterized by …