SUMMARY OF INVENTION The testing methods and apparatus of this invention obviate or
mitigate some of the problems of known test methods and apparatus as described above …

In general, the invention features in one aspect appa ratus for testing LSI and memory
devices by injecting test signals and comparing resulting output signals with standards, the …

An error detection and correction system locates and corrects double errors in a received
data block word digitally encoded in a Reed-Solomon code (n, K) as coefficient terms of an n …

A parity and/or syndrome generator generates a block parity check for the detection and/or
correction of errors in a multi-channel digital data communication system using a linear code …

57 ABSTRACT A test signal generator for generating signals for use in a high definition
television, the apparatus including means for storing a plurality of pattern segments which …

Abstract An Algorithmic Test Pattern Generator (APG) of sufficient simplicity to be replicated
at every pin of a tester. This APG is comprised of two counters and various controls capable …

A registration system for use with a document inspection system wherein a test document is
compared with a master document stored in a computer memory in which the registration …

BACKGROUND OF THE INVENTION This invention relates to providing sequences of test
data for testing large-scale integration devices (LSIs). Typically, sequences of as many as …

The signal distribution function in a signal distribution system is performed in a switching
matrix under the control of a hybrid controller. With respect to the switching matrix, there are …

A timing generator for generating a plurality of pulse sequences within a test cycle. Each
pulse sequence has a plurality of pulses having a position identified by the data contents of …