Temperature influence on GaN HEMT equivalent circuit

G Crupi, A Raffo, G Avolio… - IEEE Microwave and …, 2016 - ieeexplore.ieee.org
The purpose of this letter is to present an experimental analysis of the temperature effects on
the small-signal equivalent circuit of a GaN HEMT. With the aim of contributing to the …

The large world of FET small‐signal equivalent circuits

G Crupi, A Caddemi, DMMP Schreurs… - … Journal of RF and …, 2016 - Wiley Online Library
The small‐signal equivalent circuit modeling of microwave field‐effect transistors (FETs) is
an evergreen and ever flourishing research field that has to be up‐to‐date with …

Noise characterization and modeling of GaN-HEMTs at cryogenic temperatures

MA Mebarki, RFD Del Castillo… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
We report on the noise characterization and modeling of AlGaN/GaN high-electron-mobility
transistors (HEMTs) at a cryogenic temperature (CT) of K within the frequency range of 4.5 …

Surface potential based modeling of thermal noise for HEMT circuit simulation

A Dasgupta, S Khandelwal… - IEEE Microwave and …, 2015 - ieeexplore.ieee.org
In this letter, an analytical surface potential based compact model for thermal noise in high
electron mobility transistors (HEMTs) is presented. The model is based on the recently …

A study of DC and RF transconductance for different technologies of HEMT at low and high temperatures

MA Alim, A Jarndal, C Gaquiere, G Crupi - Journal of Materials Science …, 2023 - Springer
We report on the measured effects of temperature on the DC and RF transconductance for
several important HEMT technologies. Six different HEMT transistors were evaluated. Single …

High-periphery GaN HEMT modeling up to 65 GHz and 200° C

G Crupi, A Raffo, V Vadalà, G Vannini, A Caddemi - Solid-State Electronics, 2019 - Elsevier
In this article, we report on the temperature-dependent GaN HEMT behavior. To evaluate the
potentialities of this kind of active solid-state electronic device at its best, the experiments are …

An improved noise modeling method using a quasi-physical zone division model for algan/gan hemts

S Mao, R Xu, B Yan, Y Xu - IEEE Transactions on Electron …, 2023 - ieeexplore.ieee.org
Accurate characterization of transistor noise performance is significant for low-noise
amplifier (LNA) design. The conventional empirical noise model contains too many fitting …

Temperature-dependent access resistances in large-signal modeling of millimeter-wave AlGaN/GaN HEMTs

X Zhao, Y Xu, Y Jia, Y Wu, R Xu, J Li… - IEEE Transactions …, 2017 - ieeexplore.ieee.org
In this paper, a new method for the separate extraction of the temperature-dependent source
(R s) and drain (R d) access resistances in gallium nitride (GaN) high electron-mobility …

An X-band AlGaN/GaN MMIC receiver front-end

M Thorsell, M Fagerlind, K Andersson… - IEEE Microwave and …, 2009 - ieeexplore.ieee.org
This letter presents an integrated AlGaN/GaN X-band receiver front-end. This is to the
authors knowledge the first published results of an integrated AlGaN/GaN MMIC receiver …

Investigation on the thermal behavior of microwave GaN HEMTs

G Crupi, G Avolio, A Raffo, P Barmuta… - Solid-state …, 2011 - Elsevier
The investigation of the DC and microwave characteristics versus the ambient temperature
is a key issue for active solid-state devices, since the operating temperature can strongly …