In this article, spectroscopic ellipsometry studies of plasmon resonances at metal–dielectric
interfaces of thin films are reviewed. We show how ellipsometry provides valuable non …

Organic electronics have emerged as a viable competitor to amorphous silicon for the active
layer in low‐cost electronics. The critical performance of organic electronic materials is …

A preceding companion paper provides a general introduction to Variable Angle
Spectroscopic Ellipsometry (VASE), and also describes many typical applications of the …

For what is the first time, to our knowledge, we report on the extension of spectroscopic
rotating-analyzer ellipsometry to generalized ellipsometry to define and to determine three …

In this paper the problem of optical anisotropies in conjugated polymer thin films is revisited
and the results in the literature are critically reappraised. Several models for upper bounds …

4,999,686 5,001,523 5,003,359 5,033,812 5,048,907 5,061,030 5,078,516 5,101,459
5,109,464 5,125,065 5,132,843 5,146,513 5,148,507 5, 199,092 5,200,939 5,222,162 …

The thickness resolution and in situ advantage of ellipsometry make this optical technique
particularly suitable for studies of thin organic layers of biological interest. Early ellipsometric …

Extension of spectroscopic rotating-analyzer ellipsometry with automated compensator
function to generalized ellipsometry (GE) is reported in order to define and determine three …

We report for the first time on the application of generalized ellipsometry at far-infrared
wavelengths (wave numbers from 150 cm^-1 to 600 cm^-1) for measurement of the …

Analytic expressions for the eigenvalues for the four-wave components at an oblique angle
of light incidence inside a randomly oriented anisotropic magneto-optic dielectric medium …