The kinetics of the solid-state reaction between nanolayers of polycrystalline copper and
amorphous silicon (a-Si) has been studied in a Cu/a-Si thin-film system by the methods of …

The kinetics of diffusion and formation of Al-Au intermetallic compounds in a solid-state
reaction between layers of aluminum and gold has been studied by the method of in situ …

The effect of the aluminum layer on the kinetics and mechanism of aluminum-induced
crystallization (AIC) of amorphous silicon (a-Si) in (Al/a-Si) n multilayered films was studied …

The results of the structural and magnetic studies of the epitaxial structure prepared during
the simultaneous evaporation from two iron and silicon sources on an atomically pure Si …

To understand the mechanism of mass transfer during solid state reactions and order-
disorder transitions the formation processes of CuAuI and L1 0-FePd ordered structures at …

Solid state reaction processes in Cu/Al thin films have been studied using the methods of in
situ electron diffraction and electrical resistivity measurements. The solid state reaction in the …

A solid-state reaction process in Ag/Al multilayer thin films has been investigated by the
methods of in situ electron diffraction, simultaneous thermal analysis, transmission electron …

The problem under study is concerned with amorphous silicon (a-Si) crystallization which is
induced by an intermetallic compound, with this compound chosen to be Al 2 Cu, formed by …

A sequence of phases forming during the solid-phase reaction in Al/Pt bilayer thin films has
been investigated by in situ electron diffraction. It is shown that the amorphous PtAl 2 phase …

The processes of phase formation during a solid-state reaction between Fe and Al
nanolayers have been investigated by the in situ electron diffraction method. It is established …