A carbon nano-tube field effect transistor based stable, low-power 8T static random access memory cell with improved write access time
Carbon nanotube field effect transistor (CNTFET) is swiftly becoming an alternative to
conventional CMOS transistors due to superior transport properties, improved current …
conventional CMOS transistors due to superior transport properties, improved current …
Scaling beyond 7nm node: An overview of gate-all-around fets
W Hu, F Li - 2021 9th international symposium on next …, 2021 - ieeexplore.ieee.org
Gate-all-around (GAA) is a promising MOSFET structure to continue scaling down the size of
CMOS devices beyond 7 nm technology node. This paper gives an overview of different …
CMOS devices beyond 7 nm technology node. This paper gives an overview of different …
Performance and device design based on geometry and process considerations for 14/16-nm strained FinFETs
FAM Rezali, NAF Othman, M Mazhar… - … on Electron Devices, 2016 - ieeexplore.ieee.org
The multigated architecture of FinFETs appear attractive for continued CMOS scaling with
the addition of discrete fin sizing that brings a new variable into the design. In this paper, a …
the addition of discrete fin sizing that brings a new variable into the design. In this paper, a …
Spacer engineering for performance enhancement of junctionless accumulation‐mode bulk FinFETs
This study investigates the performance of the junctionless accumulation‐mode (JAM) bulk
FinFETs. Different electrical parameters are simulated and analysed for the device with …
FinFETs. Different electrical parameters are simulated and analysed for the device with …
Impact of Gate Length and Doping Variation on the DC and Analog/RF Performance of sub - 3nm Stacked Si Gate-All-Around Nanosheet FET
Abstract The nanosheet Field Effect Transistors (FETs) are the promising device architecture
for sub-5 nm technology node as per the International Roadmap for Devices and Systems …
for sub-5 nm technology node as per the International Roadmap for Devices and Systems …
Geometrical variability impact on the performance of sub-3 nm gate-all-around stacked nanosheet FET
To meet the scaling targets and continue with Moore's Law, the transition from FinFET to
Gate-All-Around (GAA) nanosheet Field Effect Transistors (FETs) is the necessity for low …
Gate-All-Around (GAA) nanosheet Field Effect Transistors (FETs) is the necessity for low …
The effect of shallow trench isolation and sinker on the performance of dual-gate LDMOS device
S Chahar, GM Rather - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, a dual-gate laterally double-diffused metal-oxide-semiconductor (DG-LDMOS)
device with shallow trench isolation (STI) and sinker at the source side has been proposed …
device with shallow trench isolation (STI) and sinker at the source side has been proposed …
Temperature-dependent short-channel parameters of FinFETs
RR Das, S Maity, A Choudhury, A Chakraborty… - Journal of …, 2018 - Springer
The remarkable development and continual proliferation of research in the nanotechnology
field have led to improvement in the efficiency of elementary devices. To improve their …
field have led to improvement in the efficiency of elementary devices. To improve their …
Impact of fin width on nano scale tri-gate FinFET including the quantum mechanical effect
Impact of fin width on nano scale tri-gate FinFET including the quantum mechanical effect -
IOPscience Skip to content IOP Science home Accessibility Help Search Journals Journals list …
IOPscience Skip to content IOP Science home Accessibility Help Search Journals Journals list …
A study on modeling and simulation of Multiple-Gate MOSFETs
Endless scaling of planar MOSFET over the past four decades has delivered proliferating
transistor density and performance to integrated circuits (ICs) at the cost of increase in short …
transistor density and performance to integrated circuits (ICs) at the cost of increase in short …