In this paper, we review the current state of phase plate imaging in a transmission electron
microscope. We focus especially on the hole-free phase plate design, also referred to as the …

A systematic study on charging of carbon thin films under intense electron-beam irradiation
was performed in a transmission electron microscope to identify the underlying physics for …

It is well known that insulating samples can accumulate electric charges from exposure to an
electron beam. How the accumulation of charge affects imaging parameters and sample …

Electrostatic charging of specimens during electron, photon or ion irradiation is a
complicated and poorly understood phenomenon, which can affect the acquisition and …

We studied the charging behavior of an amorphous carbon thin film kept at liquid-nitrogen
temperature under focused electron-beam irradiation. Negative charging of the thin film is …

We investigated magnetic textures in a Sc-doped hexaferrite film by means of phase
microscopy with a hole-free phase plate in a transmission electron microscope. In a zero …

Hole-free phase plates (HFPPs), also known as Volta phase plates, were already
demonstrated to be well suited for in-focus transmission electron microscopy imaging of …

Electron microscopy is a powerful tool for visualizing the shapes of sub-nanometer objects.
However, Contrast Transfer Function (CTF) principally restricts lower frequency components …

We explore the possibility of applying physical phase plates (PPs) in combination with
aberration-corrected transmission electron microscopy. Phase-contrast transfer …

Numerous physical phase plates (PP) for phase-contrast enhancement in transmission
electron microscopy (TEM) have been proposed and studied with the hole-free or Volta PP …