Conduction-band offsets in pseudomorphic As/As quantum wells (0.07≤x≤0.18) measured by deep-level transient spectroscopy

N Debbar, D Biswas, P Bhattacharya - Physical Review B, 1989 - APS
The variation of the potential of a quantum well is similar to that of a deep trap. In that respect
a quantum well can capture and emit carriers in much the same way as a trap. The thermal …

Characterization of electron trap states due to InAs quantum dots in GaAs

C Walther, J Bollmann, H Kissel, H Kirmse… - Applied Physics …, 2000 - pubs.aip.org
InAs quantum dots grown in a GaAs matrix are investigated using capacitive transient
spectroscopy and transmission electron microscopy (TEM). Two deep levels are detected …

Accurate determination of the conduction‐band offset of a single quantum well using deep level transient spectroscopy

X Letartre, D Stievenard, E Barbier - Applied physics letters, 1991 - pubs.aip.org
Using deep level transient spectroscopy, we have determined the band offset of a
GaAs/GaInAs/GaAs single quantum well. To interpret the data, we propose an original …

Optical properties and Stokes shifts in lamp‐annealed InGaAs/GaAs strained layer superlattice

GP Kothiyal, P Bhattacharya - Journal of applied physics, 1988 - pubs.aip.org
The effect of incoherent lamp annealing on the photoluminescence and optical absorption
characteristics in In x Ga1− x As/GaAs (x= 0.2 and 0.24) strained layer superlattices grown …

Deep electron traps in GaAs/n‐AlxGa1−xAs single‐quantum wells

DJ As, PW Epperlein, PM Mooney - Journal of applied physics, 1988 - pubs.aip.org
Deep‐level‐transient spectroscopy on molecular‐beam epitaxially grown square GaAs/n‐Al
x Ga1− x As (x= 0.24–0.39) single‐quantum wells shows a series of electron traps in the …

Non-exponential capture of electrons in GaAs with embedded InAs quantum dots

C Walther, J Bollmann, H Kissel, H Kirmse… - Physica B: Condensed …, 1999 - Elsevier
InAs quantum dots grown in a GaAs matrix are investigated using capacitance transient
spectroscopy and transmission electron microscopy (TEM). Trap states are measured which …

Determination of the valence band offset of Si/Si0.7Ge0.3/Si quantum wells using deep level transient spectroscopy

L Vescan, R Apetz, H Lüth - Journal of applied physics, 1993 - pubs.aip.org
Deep level transient spectroscopy (DLTS) was performed on p‐isotype Si/SiGe/Si Schottky
barrier diodes in order to obtain the valence band offset between Si and SiGe. A single …

Trap behavior in nonintentionally doped AlGaAs/GaAs single quantum well structures

KL Jiao, WA Anderson - Journal of applied physics, 1993 - pubs.aip.org
The GaAs/AlGaAs single quantum well (SQW) samples with nonintentionally doped
confining layers were studied using deep level transient spectroscopy (DLTS) and …

Determination of the conduction‐band offset of a single AlGaAs barrier layer using deep level transient spectroscopy

QS Zhu, SM Mou, XC Zhou, ZT Zhong - Applied physics letters, 1993 - pubs.aip.org
The tunneling from an AlGaAs confined thin layer to a GaAs layer in the GaAs/Al0. 33Ga0.
67As/GaAs structure during the trapped electron emission from deep level in the AlGaAs to …

Embedded tin nanocrystals in silicon—an electrical characterization

L Scheffler, MJ Haastrup, S Roesgaard… - …, 2018 - iopscience.iop.org
Tin nanocrystals embedded in a SiSn layer grown by molecular beam epitaxy on n-type Si
are investigated by means of deep level transient spectroscopy. Two Sn related deep traps …