Integration of an ultra-fast active quenching circuit with a monolithic 3D SPAD pixel in a 28 nm FD-SOI CMOS technology
MD Lakeh, JB Kammerer, JB Schell, D Issartel… - Sensors and Actuators A …, 2023 - Elsevier
This work presents several ultra-fast Active Quenching-Active Reset (AQAR) circuits with a
novel avalanche detection circuit, fabricated in a 28 nm Fully Depleted Silicon on Insulator …
novel avalanche detection circuit, fabricated in a 28 nm Fully Depleted Silicon on Insulator …
DC to AC Analysis of HC vs. BTI damage in N-EDMOS used in Single Photon Avalanche Diode cell
H Pitard, A Bravaix, X Federspiel, R Fillon… - Microelectronics …, 2023 - Elsevier
Abstract N-channel Extended Drain Metal Oxide Semiconductor (EDMOS) device is
analysed through its sensitivity to Hot-Carrier (HC), hot hole (HH) injections and Positive …
analysed through its sensitivity to Hot-Carrier (HC), hot hole (HH) injections and Positive …
3D electro-optical simulations for improving the photon detection probability of SPAD implemented in FD-SOI CMOS technology
S Gao, D Issartel, R Orobtchouk… - … on Simulation of …, 2021 - ieeexplore.ieee.org
In this article, a 3D electro-optical simulation method is presented in order to estimate the
Photon Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD). The …
Photon Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD). The …
Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell through Quasi-Static Modeling
A Bravaix, H Pitard, X Federspiel, F Cacho - Micromachines, 2024 - mdpi.com
A single photon avalanche diode (SPAD) cell using N-channel extended-drain metal oxide
semiconductor (N-EDMOS) is tested for its hot-carrier damage (HCD) resistance. The …
semiconductor (N-EDMOS) is tested for its hot-carrier damage (HCD) resistance. The …
An ultrafast active quenching circuit for SPAD in CMOS 28nm FDSOI technology
MD Lakeh, JB Kammerer, W Uhring… - 2020 IEEE …, 2020 - ieeexplore.ieee.org
A very fast Active Quenching-Active Reset Circuit is proposed for the afterpulsing reduction
in a Single Photon Avalanche Diode (SPAD). The proposed circuit is designed in a 28 nm …
in a Single Photon Avalanche Diode (SPAD). The proposed circuit is designed in a 28 nm …
SPAD FDSOI cell optimization for lower dark count rate achievement
D Issartel, TC de Albuquerque, R Clerc… - … Integration on Silicon …, 2020 - ieeexplore.ieee.org
This article presents an optimization of Single Photon Avalanche Diodes (SPAD)
implemented in CMOS 28nm Fully Depleted Silicon-On-Insulator technology. With the …
implemented in CMOS 28nm Fully Depleted Silicon-On-Insulator technology. With the …
Improving the Photon Detection Probability of SPAD implemented in FD-SOI CMOS Technology with light-trapping concept
S Gao, D Issartel, R Orobtchouk… - … Integration on Silicon …, 2021 - ieeexplore.ieee.org
This article proposes a 3D electro-optical simulation method to estimate the Photon
Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD) implemented in …
Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD) implemented in …
[PDF][PDF] Modeling of integrated single photon avalanche diodes and design of an ultra-low-power analog readout circuit
Single-photon avalanche diodes (SPADs) are highly sensitive photodetectors capable of
detecting light at the photon level. SPADs have a wide range of applications, including …
detecting light at the photon level. SPADs have a wide range of applications, including …
An active quenching circuit for a native 3D SPAD pixel in a 28 nm CMOS FDSOI technology
MD Lakeh, JB Kammerer, JB Schell… - 2021 19th IEEE …, 2021 - ieeexplore.ieee.org
The first Active Quenching-Active Reset (AQAR) circuit for a novel inherent 3D SPAD pixel is
designed in a 28 nm CMOS Fully Depleted Silicon On Insulator (FDSOI) technology. Thanks …
designed in a 28 nm CMOS Fully Depleted Silicon On Insulator (FDSOI) technology. Thanks …
Implémentation de diode à avalanche à photon unique (SPAD) dans une technologie CMOS FD-SOI 28nm
D Issartel - 2021 - theses.hal.science
L'objectif de cette thèse concerne la simulation, la conception et la caractérisation de
nouvelles structures de diodes à avalanche à photon unique (Single Photon Avalanche …
nouvelles structures de diodes à avalanche à photon unique (Single Photon Avalanche …