Dense depth maps-based human pose tracking and recognition in dynamic scenes using ridge data
A Jalal, Y Kim - 2014 11th IEEE international conference on …, 2014 - ieeexplore.ieee.org
This paper addresses the problem of automatic detection, tracking and recognition of three-
dimensional human poses from monocular depth video sequences for machine vision …
dimensional human poses from monocular depth video sequences for machine vision …
Efficient yield optimization for analog and SRAM circuits via Gaussian process regression and adaptive yield estimation
M Wang, W Lv, F Yang, C Yan, W Cai… - … on Computer-Aided …, 2017 - ieeexplore.ieee.org
In this paper, a Bayesian optimization approach is proposed for yield optimization of analog
and SRAM circuits. Gaussian process (GP) regression is employed to predict the yield over …
and SRAM circuits. Gaussian process (GP) regression is employed to predict the yield over …
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space
Accurately estimating the rare failure rates for nanoscale circuit blocks (eg, static random-
access memory, D flip-flop, etc.) is a challenging task, especially when the variation space is …
access memory, D flip-flop, etc.) is a challenging task, especially when the variation space is …
SRAM assist techniques for operation in a wide voltage range in 28-nm CMOS
Reducing static random-access memory (SRAM) operational voltage (Vmin) can greatly
improve energy efficiency, yet SRAM Vmin does not scale with technology due to increased …
improve energy efficiency, yet SRAM Vmin does not scale with technology due to increased …
Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis
The impact of process variation in deep-submicron technologies is especially pronounced
for SRAM architectures which must meet demands for higher density and higher …
for SRAM architectures which must meet demands for higher density and higher …
A 512kb 8T SRAM macro operating down to 0.57 V with an AC-coupled sense amplifier and embedded data-retention-voltage sensor in 45 nm SOI CMOS
An 8T SRAM fabricated in 45 \, nm SOI CMOS exhibits voltage scalable operation from 1.2 \,
V down to 0.57 \, V with access times from 400 \, ps to 3.4 \, ns. Timing variation and the …
V down to 0.57 \, V with access times from 400 \, ps to 3.4 \, ns. Timing variation and the …
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated
L Pang, Z Wang, R Shi, M Yao, X Shi, H Yan, L Shi - Integration, 2023 - Elsevier
SRAM yield analysis is critical to the robust SRAM design. However, it is a quite difficult to
estimate the SRAM yield because the circuit failure is a “rare-event”. Existing methods are …
estimate the SRAM yield because the circuit failure is a “rare-event”. Existing methods are …
Efficient SRAM failure rate prediction via Gibbs sampling
C Dong, X Li - Proceedings of the 48th Design Automation …, 2011 - dl.acm.org
Statistical analysis of SRAM has emerged as a challenging issue because the failure rate of
SRAM cells is extremely small. In this paper, we develop an efficient importance sampling …
SRAM cells is extremely small. In this paper, we develop an efficient importance sampling …
System and method for performing SRAM write assist
BM Zimmer, ME Sinangil - US Patent 8,861,290, 2014 - Google Patents
(57) ABSTRACT A method and a system are provided for performing write assist. Write
assist circuitry is initialized and Voltage collapse is initiated to reduce a column supply …
assist circuitry is initialized and Voltage collapse is initiated to reduce a column supply …
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis
K Katayama, S Hagiwara, H Tsutsui… - 2010 IEEE/ACM …, 2010 - ieeexplore.ieee.org
In this paper, a significant acceleration of estimating low-failure rate in a high-dimensional
SRAM yield analysis is achieved using sequential importance sampling. The proposed …
SRAM yield analysis is achieved using sequential importance sampling. The proposed …