A critical literature review of focused electron beam induced deposition

WF Van Dorp, CW Hagen - Journal of Applied Physics, 2008 - pubs.aip.org
An extensive review is given of the results from literature on electron beam induced
deposition. Electron beam induced deposition is a complex process, where many and often …

Focused, nanoscale electron-beam-induced deposition and etching

SJ Randolph, JD Fowlkes, PD Rack - Critical reviews in solid state …, 2006 - Taylor & Francis
Focused electron-beam-induced (FEB-induced) deposition and etching are versatile, direct-
write nanofabrication schemes that allow for selective deposition or removal of a variety of …

Gas-assisted focused electron beam and ion beam processing and fabrication

I Utke, P Hoffmann, J Melngailis - … of Vacuum Science & Technology B …, 2008 - pubs.aip.org
Beams of electrons and ions are now fairly routinely focused to dimensions in the nanometer
range. Since the beams can be used to locally alter material at the point where they are …

Nanoscale 3D chiral plasmonic helices with circular dichroism at visible frequencies

M Esposito, V Tasco, M Cuscuna, F Todisco… - Acs …, 2015 - ACS Publications
The nanoscaling of metamaterial structures represents a technological challenge toward
their application in the optical frequency range. In this work we demonstrate tailored chiro …

Direct-write 3D nanoprinting of plasmonic structures

R Winkler, FP Schmidt, U Haselmann… - … applied materials & …, 2017 - ACS Publications
During the past decade, significant progress has been made in the field of resonant optics
ranging from fundamental aspects to concrete applications. While several techniques have …

Creating pure nanostructures from electron-beam-induced deposition using purification techniques: a technology perspective

A Botman, JJL Mulders, CW Hagen - Nanotechnology, 2009 - iopscience.iop.org
The creation of functional nanostructures by electron-beam-induced deposition (EBID) is
becoming more widespread. The benefits of the technology include fast'point-and …

Focused electron beam-based 3D nanoprinting for scanning probe microscopy: a review

H Plank, R Winkler, CH Schwalb, J Hütner, JD Fowlkes… - Micromachines, 2019 - mdpi.com
Scanning probe microscopy (SPM) has become an essential surface characterization
technique in research and development. By concept, SPM performance crucially depends …

Purification of platinum and gold structures after electron-beam-induced deposition

A Botman, JJL Mulders, R Weemaes… - Nanotechnology, 2006 - iopscience.iop.org
The technique of electron-beam-induced deposition (EBID), when performed with organic
precursors, typically results in relatively low metal content due to the partial decomposition of …

Mechanical properties of 3D nanostructures obtained by focused electron/ion beam-induced deposition: A review

I Utke, J Michler, R Winkler, H Plank - Micromachines, 2020 - mdpi.com
This article reviews the state-of-the-art of mechanical material properties and measurement
methods of nanostructures obtained by two nanoscale additive manufacturing methods: gas …

Electron-beam-induced carbon contamination in STEM-in-SEM: Quantification and mitigation

M Hugenschmidt, K Adrion, A Marx… - Microscopy and …, 2023 - academic.oup.com
Contamination is an undesired side effect in many electron microscopy studies that covers
structures of interest and degrades resolution. Although contamination has been studied for …