Chip-last (RDL-first) fan-out panel-level packaging (FOPLP) for heterogeneous integration
JH Lau, CT Ko, CY Peng, KM Yang… - Journal of …, 2020 - meridian.allenpress.com
In this investigation, the chip-last, redistribution-layer (RDL)–first, fan-out panel-level
packaging (FOPLP) for heterogeneous integration is studied. Emphasis is placed on the …
packaging (FOPLP) for heterogeneous integration is studied. Emphasis is placed on the …
Three-dimensional level set based Bosch process simulations using ray tracing for flux calculation
O Ertl, S Selberherr - Microelectronic Engineering, 2010 - Elsevier
This paper presents three-dimensional simulations of deep reactive ion etching processes,
also known as Bosch processes. A Monte Carlo method, accelerated by ray tracing …
also known as Bosch processes. A Monte Carlo method, accelerated by ray tracing …
Numerical methods for topography simulation
O Ertl - 2010 - repositum.tuwien.at
The simulation of semiconductor manufacturing steps allows for a better understanding of
the underlying physics as well as for process optimizations, without the need for costly …
the underlying physics as well as for process optimizations, without the need for costly …
Simulation of microloading and ARDE in DRIE
MA Gosalvez, Y Zhou, Y Zhang… - … Conference on Solid …, 2015 - ieeexplore.ieee.org
An atomisitic etching model is combined with a continuum concentration solver in order to
realistically simulate various effects during Deep Reactive Ion Etching (DRIE or the Bosch …
realistically simulate various effects during Deep Reactive Ion Etching (DRIE or the Bosch …
Particle swarm optimization-based continuous cellular automaton for the simulation of deep reactive ion etching
We combine the particle swarm optimization (PSO) method and the continuous cellular
automaton (CCA) in order to simulate deep reactive ion etching (DRIE), also known as the …
automaton (CCA) in order to simulate deep reactive ion etching (DRIE), also known as the …
An improved parallel implementation of 3-D DRIE simulation on multi-core processors
Deep reactive ion etching (DRIE) technique is a new and powerful tool in Micro-Electro-
Mechanical Systems (MEMS) fabrication. A 3-D DRIE simulation can help researcher …
Mechanical Systems (MEMS) fabrication. A 3-D DRIE simulation can help researcher …
Transitional approach to evaluate customer satisfaction for e-Books
M Iwashita - 2017 18th IEEE/ACIS International Conference on …, 2017 - ieeexplore.ieee.org
An ongoing problem facing all companies is how to continuously satisfy customers.
Customer satisfaction has been generally determined to be an indicator utilized by …
Customer satisfaction has been generally determined to be an indicator utilized by …
Integrated 3-D Simulation Tool for Micro and Nano Fabrication
This paper introduces an integrated 3-D simulation and visualization environment for
Micro/Nano fabrication processes. From the nanostructures in several hundred nanometers …
Micro/Nano fabrication processes. From the nanostructures in several hundred nanometers …
[PDF][PDF] Aluminum oxide hard mask fabrication by focused ion beam implantation and wet etching
Z Liu - 2012 - aaltodoc.aalto.fi
A novel aluminum oxide (Al2O3) hard mask fabrication process with nanoscale resolution is
introduced in this work. The Al2O3 mask can be used for various purposes, and in this thesis …
introduced in this work. The Al2O3 mask can be used for various purposes, and in this thesis …
IP library-based general and visualized MEMS device simulation and verification tool
X Zhao, Y Tan, G Lu, X Li - 2010 IEEE 5th International …, 2010 - ieeexplore.ieee.org
In this paper, we present an IP (Intellectual Property) library-based general and visualized
MEMS device simulation and verification tool in order to solve the problem that: 1. inaccurate …
MEMS device simulation and verification tool in order to solve the problem that: 1. inaccurate …