Chip-last (RDL-first) fan-out panel-level packaging (FOPLP) for heterogeneous integration

JH Lau, CT Ko, CY Peng, KM Yang… - Journal of …, 2020 - meridian.allenpress.com
In this investigation, the chip-last, redistribution-layer (RDL)–first, fan-out panel-level
packaging (FOPLP) for heterogeneous integration is studied. Emphasis is placed on the …

Three-dimensional level set based Bosch process simulations using ray tracing for flux calculation

O Ertl, S Selberherr - Microelectronic Engineering, 2010 - Elsevier
This paper presents three-dimensional simulations of deep reactive ion etching processes,
also known as Bosch processes. A Monte Carlo method, accelerated by ray tracing …

Numerical methods for topography simulation

O Ertl - 2010 - repositum.tuwien.at
The simulation of semiconductor manufacturing steps allows for a better understanding of
the underlying physics as well as for process optimizations, without the need for costly …

Simulation of microloading and ARDE in DRIE

MA Gosalvez, Y Zhou, Y Zhang… - … Conference on Solid …, 2015 - ieeexplore.ieee.org
An atomisitic etching model is combined with a continuum concentration solver in order to
realistically simulate various effects during Deep Reactive Ion Etching (DRIE or the Bosch …

Particle swarm optimization-based continuous cellular automaton for the simulation of deep reactive ion etching

Y Li, MA Gosálvez, P Pal, K Sato… - … of Micromechanics and …, 2015 - iopscience.iop.org
We combine the particle swarm optimization (PSO) method and the continuous cellular
automaton (CCA) in order to simulate deep reactive ion etching (DRIE), also known as the …

An improved parallel implementation of 3-D DRIE simulation on multi-core processors

F Zhang, G Wang, X Liu, G Sun, X Zhao… - 2008 10th IEEE …, 2008 - ieeexplore.ieee.org
Deep reactive ion etching (DRIE) technique is a new and powerful tool in Micro-Electro-
Mechanical Systems (MEMS) fabrication. A 3-D DRIE simulation can help researcher …

Transitional approach to evaluate customer satisfaction for e-Books

M Iwashita - 2017 18th IEEE/ACIS International Conference on …, 2017 - ieeexplore.ieee.org
An ongoing problem facing all companies is how to continuously satisfy customers.
Customer satisfaction has been generally determined to be an indicator utilized by …

Integrated 3-D Simulation Tool for Micro and Nano Fabrication

G Sun, X Zhao, G Lu, H Zhang - 2008 8th IEEE Conference on …, 2008 - ieeexplore.ieee.org
This paper introduces an integrated 3-D simulation and visualization environment for
Micro/Nano fabrication processes. From the nanostructures in several hundred nanometers …

[PDF][PDF] Aluminum oxide hard mask fabrication by focused ion beam implantation and wet etching

Z Liu - 2012 - aaltodoc.aalto.fi
A novel aluminum oxide (Al2O3) hard mask fabrication process with nanoscale resolution is
introduced in this work. The Al2O3 mask can be used for various purposes, and in this thesis …

IP library-based general and visualized MEMS device simulation and verification tool

X Zhao, Y Tan, G Lu, X Li - 2010 IEEE 5th International …, 2010 - ieeexplore.ieee.org
In this paper, we present an IP (Intellectual Property) library-based general and visualized
MEMS device simulation and verification tool in order to solve the problem that: 1. inaccurate …