Frequency and bias-dependent modeling of correlated base and collector current RF noise in SiGe HBTs using quasi-static equivalent circuit

K Xia, G Niu, DC Sheridan… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
This paper presents modeling of correlated RF noise in the intrinsic base and collector
currents of SiGe heterojunction bipolar transistors using quasi-static equivalent circuits. The …

Discussions and extension of van Vliet's noise model for high speed bipolar transistors

K Xia, G Niu - Solid-state electronics, 2009 - Elsevier
The general van Vliet noise model for transistors was derived for base minority carriers only
under adiabatic boundary conditions. This paper extends the model by including the emitter …

Modeling the input non-quasi-static effect in small signal equivalent circuit based on charge partitioning for bipolar transistors and its impact on RF noise modeling

K Xia, G Niu - Solid-state electronics, 2010 - Elsevier
This paper models the input non-quasi-static (NQS) effect of bipolar transistors using charge
partitioning. The input NQS effect associated with the base minority carrier transport is …

Improved RF noise modeling for silicon-germanium heterojunction bipolar transistors

K Xia - 2006 - etd.auburn.edu
Accurate radio frequency (RF) noise models for individual transistors are critical to minimize
noise during mixed-signal analog and RF circuit design. This dissertation proposes two …

Impact of collector-base space charge region on rf noise in bipolar transistors

K Xia, G Niu - 2006 Bipolar/BiCMOS Circuits and Technology …, 2006 - ieeexplore.ieee.org
This paper examines the impact of collector-base space charge region (CB SCR) on RF
noise in scaled bipolar transistors by solving the Langevin equation of electron noise …

Modeling of intrinsic base majority carrier thermal noise for sige hbts including fringe be junction effect

K Xia, G Niu - 2006 Bipolar/BiCMOS Circuits and Technology …, 2006 - ieeexplore.ieee.org
This paper investigates the impact of fringe BE junction on base majority carrier RF noise in
SiGe HBTs. Due to fringe effect, the base hole noise should be modeled by correlated noise …

[引用][C] SiGe HBT 射频噪声模型研究

辛金锋, 王军 - 通信技术, 2011