A review of damage, void evolution, and fatigue life prediction models

HW Lee, C Basaran - Metals, 2021 - mdpi.com
Degradation, damage evolution, and fatigue models in the literature for various engineering
materials, mostly metals and composites, are reviewed. For empirical models established …

A critical review of constitutive models for solders in electronic packaging

G Chen, X Zhao, H Wu - Advances in Mechanical …, 2017 - journals.sagepub.com
Owing to their superior electrical, thermal, and mechanical properties, solder joints are the
most widely used interconnection materials in electronic product packaging. Because the …

Growth kinetics of intermetallic compounds in chip scale package solder joint

PL Tu, YC Chan, KC Hung, JKL Lai - Scripta materialia, 2001 - Elsevier
As the trend in requirements of electronic packaging is toward higher I/O, greater
performance, higher density, and lighter weight, the use of area array packaging technology …

Measures of entropy to characterize fatigue damage in metallic materials

H Yun, M Modarres - Entropy, 2019 - mdpi.com
This paper presents the entropic damage indicators for metallic material fatigue processes
obtained from three associated energy dissipation sources. Since its inception, reliability …

A nonlocal diffuse interface model for microstructure evolution of tin–lead solder

R Ubachs, PJG Schreurs, MGD Geers - … of the Mechanics and Physics of …, 2004 - Elsevier
Microstructural length scales are relatively large in typical soldered connections. A
microstructure which is continuously evolving is known to have a strong influence on …

A damage mechanics-based fatigue life prediction model for solder joints

H Tang, C Basaran - J. Electron. Packag., 2003 - asmedigitalcollection.asme.org
A thermomechanical fatigue life prediction model based on the theory of damage mechanics
is presented. The damage evolution, corresponding to the material degradation under cyclic …

Vibration fatigue reliability of BGA-IC package with Pb-free solder and Pb–Sn solder

YB Kim, H Noguchi, M Amagai - Microelectronics Reliability, 2006 - Elsevier
In this paper, a new method is proposed for evaluating the high-cycle fatigue strength of
BGA (Ball Grid Array) packages with Pb-free solder and Pb–Sn solder due to vibration. An …

Failure study of Sn37Pb PBGA solder joints using temperature cycling, random vibration and combined temperature cycling and random vibration tests

T An, C Fang, F Qin, H Li, T Tang, P Chen - Microelectronics Reliability, 2018 - Elsevier
In this paper, the tin-lead (Sn-37wt% Pb) eutectic solder joints of plastic ball grid array
(PBGA) assemblies are tested using temperature cycling, random vibrations, and combined …

Thermomechanical analysis of solder joints under thermal and vibrational loading

C Basaran, R Chandaroy - J. Electron. Packag., 2002 - asmedigitalcollection.asme.org
Due to the coefficient of thermal expansion (CTE) mismatch between the bonded layers, the
solder joint experiences cycling shear strain, which leads to short cycle fatigue. When …

Thermomechanical behavior of micron scale solder joints under dynamic loads

Y Zhao, C Basaran, A Cartwright, T Dishongh - Mechanics of Materials, 2000 - Elsevier
Recent trends in reliability and fatigue life analysis of electronic devices have involved
developing structural integrity models for predicting the operating lifetime under vibratory …