In this review paper, traditional and novel demodulation methods applicable to amplitude-
modulation atomic force microscopy are implemented on a widely used digital processing …

Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …

A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation
of the cantilever oscillation amplitude from the deflection signal, which might be distorted by …

Numerous dynamic atomic force micros-copy (AFM) methods have appeared in recent
years, which make use of the excitation and detection of higher order eigenmodes of the …

Using standard microelectromechanical system (MEMS) processes to coat a microcantilever
with a piezoelectric layer results in a versatile transducer with inherent self-sensing …

Emerging multifrequency atomic force microscopy (MF-AFM) methods rely on coherent
demodulation of the cantilever deflection signal at multiple frequencies. These …

In this article, we present a novel method for decoupling surface electronic properties from
topographic surface variations in scanning tunneling microscope (STM). In a conventional …

In this study, a novel artificial intelligence-based approach is presented to directly estimate
the surface topography. To this aim, performance of different artificial intelligence-based …

Nanomechanical resonant sensors that are based on detecting and tracking the resonance
frequency deviations due to events of interest are being advocated for a variety of …

In this study, a novel technique based on adaptive fading extended Kalman filter for atomic
force microscopy is proposed to directly estimate the topography of a sample surface without …