[HTML][HTML] A review of ground-based robotic systems for the characterization of nuclear environments

I Tsitsimpelis, CJ Taylor, B Lennox, MJ Joyce - Progress in nuclear energy, 2019 - Elsevier
The use of ground-based robotic systems for the characterisation of nuclear environments is
reviewed. Almost since the dawn of the nuclear energy industry, man has somewhat …

An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools

Q Huang, J Jiang - Progress in Nuclear Energy, 2019 - Elsevier
New requirements on post-accident monitoring systems in nuclear power plants pose fresh
challenges for electronic system designers and nuclear power plant personnel, in particular …

A fault-injection strategy for traction drive control systems

C Yang, C Yang, T Peng, X Yang… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
A traction drive control system (TDCS) plays an important role in safety running of high-
speed trains. This paper presents a new fault-injection strategy for safety testing and fault …

[HTML][HTML] Duckcore: A fault-tolerant processor core architecture based on the risc-v isa

J Li, S Zhang, C Bao - Electronics, 2021 - mdpi.com
With the development of large-scale CMOS-integrated circuit manufacturing technology,
microprocessor chips are more vulnerable to soft errors and radiation interference, resulting …

A soft error detection and recovery flip-flop for aggressive designs with high-performance

J Li, L Xiao, H Li, X Cao, C Wang - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Soft errors induced by Single Event Transient (SET) or Single Event Upset (SEU) are a great
threat to integrated circuits. To reduce the error rate and improve the reliability of the circuits …

A low-cost error-tolerant flip-flop against SET and SEU for dependable designs

J Li, L Xiao, L Li, H Li, H Liu… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Computing systems working in harsh environment is prone to suffer from radiation-induced
soft errors; for example, Single Event Upsets (SEUs) and Single Event Transients (SETs) are …

Designing and evaluating redundancy-based soft-error masking on a continuum of energy versus robustness

FS Alghareb, RA Ashraf… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Near-threshold computing is an effective strategy to reduce the power dissipation of deeply-
scaled CMOS logic circuits. However, near-threshold strategies exacerbate the impact of …

Energy and delay tradeoffs of soft-error masking for 16-nm FinFET logic paths: Survey and impact of process variation in the near-threshold region

FS Alghareb, RA Ashraf, A Alzahrani… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
A near-threshold voltage (NTV) operation provides a recognized approach to low-power
circuit design due to its balancing of minor performance degradation relative to its significant …

Design of soft error correction flip-flop cells for highly reliable applications

H Li, X Zhao, J Li - Microelectronics Reliability, 2024 - Elsevier
With the development of technology, the vulnerability of integrated circuits to Single Event
Effect (SEE) increases, and the sensitivity of flip-flops to soft errors induced by Single Event …

Low-power highly reliable SET-induced dual-node upset-hardened latch and flip-flop

R Islam - Canadian Journal of Electrical and Computer …, 2019 - ieeexplore.ieee.org
It appears that the relentless pursuit of Moore's law scaling from one generation of process
technology to the next increases circuit vulnerability to single-event transient (SET)-induced …