DFT investigation of BN, AlN, and SiC fullerene sensors for arsine gas detection and removal

SA Jasim, HH Kzar, AT Jalil, MM Kadhim… - Main Group …, 2022 - content.iospress.com
Quantum chemical density functional theory (DFT) calculations were performed to
investigate the adsorption of arsine (AsH3) gaseous substance at the surface of …

Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm

J MacHale, F Meaney, N Kennedy, L Eaton… - Journal of Applied …, 2019 - pubs.aip.org
Silicon (Si) has been scaled below 10 nm in multigate and silicon-on-insulator (SOI) device
technologies, but clearly Si thickness cannot be reduced indefinitely, as we will run out of …

Tertiarybutylarsine damage-free thin-film doping and conformal surface coverage of substrate-released horizontal Si nanowires

F Meaney, K Thomas, J MacHale, G Mirabelli… - Applied Surface …, 2020 - Elsevier
Conformal damage-free doping is the holy grail for 3D semiconductor device structures,
such as those used in multi-gate and nanowire-based field effect transistors (FETs). The …

Electrical Evaluation of Ion Implant, Liquid, and Gas Sources for Doping of Ultra-Thin Body SOI and Si Nanowire Structures

J MacHale, F Meaney, B Sheehan… - … Conference on Ion …, 2018 - ieeexplore.ieee.org
Introduction of dopant impurities in Si can be done in-situ during epitaxial growth, or ex-situ
for localized material modification using a variety of sources including ion implantation …