Aspects of the disclosure are directed to an analysis of a material of a component. A
radiation source is activated to transmit radiation to the component. A beam pattern is …

A method for evaluating the quality of a SiC single crystal by a non-destructive and simple
method; and a method for producing a SiC single crystal ingot with less dislocation and high …

A method includes measuring a difference between a primary X-ray diffraction peak and a
secondary X-ray diffraction peak, the primary X-ray diffraction peak corresponds to an …