A review and analysis of automatic optical inspection and quality monitoring methods in electronics industry
M Abd Al Rahman, A Mousavi - Ieee Access, 2020 - ieeexplore.ieee.org
Electronics industry is one of the fastest evolving, innovative, and most competitive
industries. In order to meet the high consumption demands on electronics components …
industries. In order to meet the high consumption demands on electronics components …
[HTML][HTML] Review of conventional and advanced non-destructive testing techniques for detection and characterization of small-scale defects
Inspection reliability of small-scale defects, targeting dimensions below 100 µm, is crucial for
structural safety of critical components in high-value applications. Early defects are often …
structural safety of critical components in high-value applications. Early defects are often …
Assessing the embodied carbon footprint of IoT edge devices with a bottom-up life-cycle approach
In upcoming years, the number of Internet-of-Things (IoT) devices is expected to surge up to
tens of billions of physical objects. However, while the IoT is often presented as a promising …
tens of billions of physical objects. However, while the IoT is often presented as a promising …
[HTML][HTML] Scanning acoustic microscopy as a non-destructive imaging tool to localize defects inside battery cells
LP Bauermann, LV Mesquita, C Bischoff… - Journal of Power …, 2020 - Elsevier
Abstract Scanning Acoustic Microscopy (SAM) is shown here for the first time to be suitable
for the visualization of defects like electrolyte leakage, faulty electrodes and gas …
for the visualization of defects like electrolyte leakage, faulty electrodes and gas …
A data-driven method for enhancing the image-based automatic inspection of IC wire bonding defects
J Chen, Z Zhang, F Wu - International journal of production …, 2021 - Taylor & Francis
Visually inspecting integrated circuit (IC) wire bonding defects is important to ensuring the
product quality after the packaging process. The availability of IC X-ray images offers an …
product quality after the packaging process. The availability of IC X-ray images offers an …
Scanning acoustic microscopy (SAM): A robust method for defect detection during the manufacturing process of ultrasound probes for medical imaging
F Bertocci, A Grandoni, T Djuric-Rissner - Sensors, 2019 - mdpi.com
The main aim of this paper is to provide the feasibility of non-destructive testing (NDT)
method, such as scanning acoustic microscopy (SAM), for damage detection in ultrasound …
method, such as scanning acoustic microscopy (SAM), for damage detection in ultrasound …
Review of THz-based semiconductor assurance
Terahertz radiation for inspection and fault detection has been of interest for the
semiconductor industry since the first generation and detection of THz signals. Until recent …
semiconductor industry since the first generation and detection of THz signals. Until recent …
Multi-scale GAN with transformer for surface defect inspection of IC metal packages
K Chen, N Cai, Z Wu, H Xia, S Zhou, H Wang - Expert Systems with …, 2023 - Elsevier
Integrated circuit plays an important role in the information technology industry. Surface
defect inspection of IC packages is an essential process in the IC packaging manufacturing …
defect inspection of IC packages is an essential process in the IC packaging manufacturing …
Recent Progress in Development of Carbon-Nanotube-Based Photo-Thermoelectric Sensors and Their Applications in Ubiquitous Non-Destructive Inspections
The photo-thermoelectric (PTE) effect in electronic materials effectively combines photo-
absorption-induced local heating and associated thermoelectric conversion for uncooled …
absorption-induced local heating and associated thermoelectric conversion for uncooled …
A review on numerical approach of reflow soldering process for copper pillar technology
This paper reviewed the state-of-art copper pillar technology in flip-chip packaging, driven
by the semiconductor industry's demands for thinner and faster data transmission. This …
by the semiconductor industry's demands for thinner and faster data transmission. This …