The past few decades have witnessed growing research interest in developing powerful
nanofabrication technologies for three-dimensional (3D) structures and devices to achieve …

Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution
microscopy and nanofabrication technique. It is an enabling technology that not only …

The focused ion beam (FIB) is a powerful tool for fabrication, modification, and
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …

Helium ion beam (HIB) technology plays an important role in the extreme fields of
nanofabrication. This paper reviews the latest developments in HIB technology as well as its …

The helium ion microscope has emerged as a multifaceted instrument enabling a broad
range of applications beyond imaging in which the finely focused helium ion beam is used …

Focused ion beam nanoscale synthesis has emerged as a critical tool for selected area
nanofabrication. Helium and neon ion beams from the gas field ion source have recently …

Helium ion beam induced cobalt nanowire deposition using dicobalt octacarbonyl (Co 2
(CO) 8) as a precursor is described. 10 nm wide metal lines were fabricated with good …

Deep neural networks (DNNs) are reshaping many fields due to their end-to-end ability to
learn directly from data, leading to outstanding performance, especially in image processing …

Focused ion beam (FIB) technology makes use of a highly-focused beam of charged ions to
perform precise nanopatterning tasks by steering it over a sample, tracing patterns defined …

The recent introduction of the helium ion microscope (HIM) offers new possibilities for
materials modification and fabrication with spatial resolution below 10 nm. In particular, the …