A review of interconnect materials used in emerging memory device packaging: First-and second-level interconnect materials

YS Zou, CL Gan, MH Chung, H Takiar - Journal of Materials Science …, 2021 - Springer
The main motivation of this review is to study the evolution of first and second level of
interconnect materials used in memory device semiconductor packaging. Evolutions of …

Applications of artificial intelligence in magnetic resonance imaging of primary pediatric cancers: a scoping review and CLAIM score assessment

B Tsang, A Gupta, MS Takahashi, H Baffi, T Ola… - Japanese Journal of …, 2023 - Springer
Purposes To review the uses of AI for magnetic resonance (MR) imaging assessment of
primary pediatric cancer and identify common literature topics and knowledge gaps. To …

[图书][B] Copper wire bonding

PS Chauhan, A Choubey, ZW Zhong, MG Pecht… - 2014 - Springer
Chapter 1 gives an introduction to Cu wire bonding technology. The advantages of Cu over
Au, such as lower cost, higher mechanical strength, and higher electrical and thermal …

Interfacial reaction during friction stir welding of Al and Cu

C Genevois, M Girard, B Huneau, X Sauvage… - … Materials Transactions A, 2011 - Springer
Commercially pure copper was joined to a 1050 aluminum alloy by friction stir welding. A
specific configuration where the tool pin was fully located in the aluminum plate was chosen …

Microstructure and origin of dislocation etch pits in GaN epilayers grown by metal organic chemical vapor deposition

L Lu, ZY Gao, B Shen, FJ Xu, S Huang… - Journal of Applied …, 2008 - pubs.aip.org
Morphology and microstructure of dislocation etch pits in GaN epilayers etched by molten
KOH have been investigated by atomic force microscopy, scanning electron microscopy …

Copper wire bonding concerns and best practices

P Chauhan, ZW Zhong, M Pecht - Journal of Electronic Materials, 2013 - Springer
Copper wire bonding of microelectronic parts has developed as a means to cut the costs of
using the more mature technology of gold wire bonding. However, with this new technology …

Interfacial microstructures and thermodynamics of thermosonic Cu-wire bonding

J Li, L Liu, L Deng, B Ma, F Wang… - IEEE Electron Device …, 2011 - ieeexplore.ieee.org
The interfacial microstructures of the Cu-wire bonding to an Al pad are investigated first by
using an X-ray microdiffractometer and high-resolution transmission electron microscopy. It …

Characterization of intermetallic compounds in Cu–Al ball bonds: Mechanical properties, interface delamination and thermal conductivity

MHM Kouters, GHM Gubbels, ODS Ferreira - Microelectronics Reliability, 2013 - Elsevier
In high power automotive electronics copper wire bonding is regarded as the most
promising alternative for gold wire bonding in 1st level interconnects and therefore …

Evolutions of bonding wires used in semiconductor electronics: perspective over 25 years

CL Gan, U Hashim - Journal of Materials Science: Materials in Electronics, 2015 - Springer
The objective of this review is to study the evolution and key findings and critical technical
challenges, solutions and future trend of bonding wires used in semiconductor electronics …

[HTML][HTML] Electrical and thermal stability of Al-Cu welds: Performance benchmarking of the hybrid metal extrusion and bonding process

A Elkjaer, JA Sørhaug, G Ringen, R Bjørge… - Journal of Manufacturing …, 2022 - Elsevier
Advances in joining processes for aluminum and copper are sought after to facilitate the
greater adoption of aluminum in electrical applications. Aluminum's chemical affinity to …