Diagnosis is essential in modern chip production to increase yield, and debug constitutes a
major part in the pre-silicon development process. For recent process technologies, defect …

A diagnostic automatic test pattern generation (DATPG) system is constructed by adding
new algorithmic capabilities to conventional ATPG and fault simulation programs. The …

It is now generally accepted that the stuck-at fault model is no longer sufficient for many
manufacturing test activities. Consequently, diagnostic test pattern generation based solely …

Diagnosis of each failed part requires the failed data captured on the test equipment.
However, due to memory limitations on the tester, one often cannot store all the failed data …

In this paper, we propose two fault-diagnosis methods for improving multiple-fault diagnosis
resolution. The first method, based on the principle of single-fault activation and single …

This paper proposes an efficient diagnosis-aware automatic test pattern generation (ATPG)
procedure that can quickly identify equivalent-fault pairs and generate diagnosis patterns …

The industry is encountering an increasing number of front-end-of-line defects in the most
advanced FinFET technology nodes due to extremely small feature size and complex …

We optimize the full-response diagnostic fault dictionary from a given test set. The smallest
set of vectors is selected without loss of diagnostic resolution of the given test set. We give …

We discuss fault equivalence and dominance relations for multiple output combinational
circuits. The conventional definition for equivalence says that" two faults are equivalent if …

A large part of microprocessor cores in use today are designed to be cheap and mass
produced. The diagnostic process, which is fundamental to improve yield, has to be as cost …