Escalating demand for mixed-signal Integrated Circuits has been accompanied by the need
to develop efficient strategies to guarantee higher quality at lower cost. One key to achieving …

This paper presents a new fault diagnosis method for switched current (SI) circuits. The
kurtoses and entropies of the signals are calculated by extracting the original signals from …

This paper presents a new switched current (SI) circuit fault diagnosis approach based on
pseudorandom test and preprocess by using entropy and Haar wavelet transform. The …

This paper addresses MEMS testing through a case study: a micromachined magnetic field
sensor with on-chip electronics. The sensor element is based on a cantilever beam that is …

A novel method based on a fault dictionary that uses entropy as a preprocessor to diagnose
faulty behavior in switched current (SI) circuit is presented in the paper. The proposed …

In this paper, a BIST scheme is proposed that applies to any kind of SI building blocks
constituted of an aggregate of identical memory cells. The fundamental idea is to reconfigure …

A built in Pseudo-Random sequence testing for testing embedded switched-current filters is
described in this paper. The generation approach of Pseudo-Random sequence and the …

This article aims at defining an efficient test strategy for switched-current (SI) circuit testing.
By checking the constructed signatures (impulse response samples) against the derived …

This paper aims at defining an efficient test strategy for switched-current circuit testing.
Taking into account the specificity of these circuits, we propose an original structural test …

Combining the time and frequency location and multiple-scale analysis of wavelet transform
with the nonlinear mapping and generalizing of neural network, an efficient defect-oriented …