Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications
R Garcia - Chemical Society Reviews, 2020 - pubs.rsc.org
Fast, high-resolution, non-destructive and quantitative characterization methods are needed
to develop materials with tailored properties at the nanoscale or to understand the …
to develop materials with tailored properties at the nanoscale or to understand the …
[图书][B] Scanning probe microscopy: the lab on a tip
E Meyer, HJ Hug, R Bennewitz - 2004 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …
Visualizing intracellular nanostructures of living cells by nanoendoscopy-AFM
M Penedo, K Miyazawa, N Okano, H Furusho… - Science …, 2021 - science.org
Atomic force microscopy (AFM) is the only technique that allows label-free imaging of
nanoscale biomolecular dynamics, playing a crucial role in solving biological questions that …
nanoscale biomolecular dynamics, playing a crucial role in solving biological questions that …
Tuning the flexural frequency of overhang-/T-shaped microcantilevers for high harmonics
High-harmonic (HH) frequencies in microcantilevers impose several applications in
precision detection thanks to the higher sensitivity of the higher modes in comparison to the …
precision detection thanks to the higher sensitivity of the higher modes in comparison to the …
[HTML][HTML] A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy
H Liu, Z Ahmed, S Vranjkovic… - Beilstein Journal of …, 2022 - beilstein-journals.org
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has
become an important tool to characterize new material systems as well as devices. Current …
become an important tool to characterize new material systems as well as devices. Current …
[PDF][PDF] A cantilever-based, ultra-high vacuum, low temperature scanning
H Liu, Z Ahmed, S Vranjkovic, M Parschau, AO Mandru… - 2022 - beilstein-journals.org
Atomic force microscopy (AFM) operated under vacuum or ultra-high vacuum (UHV)
conditions 27 is beneficial for increasing measurement sensitivity, measuring samples at low …
conditions 27 is beneficial for increasing measurement sensitivity, measuring samples at low …