Simulation methodology development of warpage estimation for epoxy molding compound under considerations of stress relaxation characteristics and curing …
CC Lee, CC Lee, CP Chang - Materials Science in Semiconductor …, 2022 - Elsevier
The thermal mismatch between different components has been a serious issue in the
reliability of electronic products. The effect of epoxy molding compound (EMC) on the …
reliability of electronic products. The effect of epoxy molding compound (EMC) on the …
Warping model of high-power IGBT modules subjected to reflow soldering process
High-power insulated gate bipolar transistor (IGBT) modules are the key devices for energy
change and transmission. Reflow soldering process is a crucial process in IGBT module …
change and transmission. Reflow soldering process is a crucial process in IGBT module …
Heat dissipation optimization and prediction for three-dimensional fan-out package
J Huang, Z He, C Li, L Zhao, X Lu - International Journal of Thermal …, 2021 - Elsevier
Excessive heat would reduce the service life and threaten the reliability of electronic
devices. To optimize the heat conduction in Fan-out (FO) package, we proposed a hybrid …
devices. To optimize the heat conduction in Fan-out (FO) package, we proposed a hybrid …
Evaluation of solder joint reliability in 3D packaging memory devices under thermal shock
S Zhou, Z Lin, B Qiu, H Wang, J Xiong, C He, B Zhou… - Electronics, 2022 - mdpi.com
In 3D packaging memory devices, solder joints are critical links between the chip and the
printed circuit board (PCB). Under severe working conditions, cracks inevitably occur due to …
printed circuit board (PCB). Under severe working conditions, cracks inevitably occur due to …
Pre-structural patterning approach for enhancing flow characteristics of B-stage film-type epoxy molding compound
Epoxy molding compound (EMC) compositions of silica powder and epoxy matrix have been
utilized as encapsulation for semiconductor packaging over the past decades. Among …
utilized as encapsulation for semiconductor packaging over the past decades. Among …
Finite element analysis of 2.5 D packaging processes based on multi-physics field coupling for predicting the reliability of IC components
W Li, X Wang, R Zheng, X Zhao, H Zheng… - Microelectronics …, 2024 - Elsevier
The 2.5 D packaging technology is a high–performance method for electronic packaging.
This study addresses the reliability issues of 2.5 D packaging during the manufacturing …
This study addresses the reliability issues of 2.5 D packaging during the manufacturing …
[HTML][HTML] Design and investigation on the reliability of a ceramic power package
L Tang, K Cao - e-Prime-Advances in Electrical Engineering …, 2022 - Elsevier
The popularity of electronic devices used in a wide range of applications has significantly
increased over recent years. As a result, more and more power packages are needed …
increased over recent years. As a result, more and more power packages are needed …
Development of high performance 2.5 D packaging using glass interposer with through glass vias
J Zhao, Z Chen, F Qin, D Yu - Journal of Materials Science: Materials in …, 2023 - Springer
5 D interposer technology has gotten a lot of attention as a viable solution to high IO density,
cost, and performance challenges. Glass is a potential choice as an interposer material in an …
cost, and performance challenges. Glass is a potential choice as an interposer material in an …
Impact of Hydrogen Voiding in Chip-to-Chip Electroless All-Copper Interconnections
N Ren, Y Zhang, W Shu, C Lu, W Zhang, Z Chen… - Micromachines, 2024 - mdpi.com
Three-dimensional (3D) integration has become a leading approach in chip packaging. The
interconnection density and reliability of micro-bumps in chip stacking are often threatened …
interconnection density and reliability of micro-bumps in chip stacking are often threatened …
Effect of Ceramic Filler in Epoxy Mold Compound on Thermomechanical Property of FOWLP
In the last five decades, electronic package devices have evolved based on Moore's law,
which states that the number of transistors in dense integrated circuits doubles …
which states that the number of transistors in dense integrated circuits doubles …