Roadmap on ferroelectric hafnia-and zirconia-based materials and devices

JPB Silva, R Alcala, UE Avci, N Barrett, L Bégon-Lours… - APL Materials, 2023 - pubs.aip.org
Ferroelectric hafnium and zirconium oxides have undergone rapid scientific development
over the last decade, pushing them to the forefront of ultralow-power electronic systems …

Reduced fatigue and leakage of ferroelectric TiN/Hf0. 5Zr0. 5O2/TiN capacitors by thin alumina interlayers at the top or bottom interface

HA Hsain, Y Lee, S Lancaster, PD Lomenzo… - …, 2023 - iopscience.iop.org
Abstract Hf 0.5 Zr 0.5 O 2 (HZO) thin films are promising candidates for non-volatile memory
and other related applications due to their demonstrated ferroelectricity at the nanoscale and …

The impact of rapid thermal annealing for the ferroelectricity of undoped sputtered HfO2 and its wake-up effect

O Gronenberg, R Marquardt, R Lamprecht… - Journal of Applied …, 2022 - pubs.aip.org
Fundamental aspects of ferroelectric HfO 2⁠, a fluorite-type oxide, are not understood yet.
This is evident by different theories regarding, eg, the wake-up effect or the antiferroelectric …

Design Strategy to Improve Memory Window in Ferroelectric Transistors With Oxide Semiconductor Channel

IJ Kim, MK Kim, JS Lee - IEEE Electron Device Letters, 2022 - ieeexplore.ieee.org
Oxide semiconductors are promising channel materials for hafnia-based ferroelectric
transistor memories because they can constrain the formation of an unwanted interfacial …

[HTML][HTML] Polarization switching in Hf0. 5Zr0. 5O2-dielectric stack: The role of dielectric layer thickness

AK Saha, M Si, PD Ye, SK Gupta - Applied Physics Letters, 2021 - pubs.aip.org
Understanding the role of the dielectric (DE) layer in ferroelectric (FE) Hf 0.5 Zr 0.5 O 2
(HZO) based devices (eg, ferroelectric-field-effect-transistors, FE-FETs) is important to …

Improving the Ferroelectric Properties of Nd:HfO Thin Films by Stacking HfZrO Interlayers

Y Xiao, Y Jiang, L Yang, N Ma, G Li… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this study, Nd: HfO2 thin films with or without the Hf0. 5Zr0. 5O2 (HZO) interlayer were
prepared on Pt/Ti/SiO2/Si substrates by the chemical solution deposition (CSD) method. It …

Ferroelectric transistor with grooved structure for reliable multi-level characteristics

IJ Kim, JS Lee - IEEE Electron Device Letters, 2023 - ieeexplore.ieee.org
Ferroelectric transistors that use hafnia-based ferroelectric materials are considered as a
promising candidate for next-generation memory devices due to their fast operation speed …

device engineering strategy of Zr-doped hfOx ferroelectric memory for unconventional computing applications

J Woo - 2021 IEEE International Symposium on Circuits and …, 2021 - ieeexplore.ieee.org
This study reports the device design strategy of ferroelectric memory based on Zr doped HfO
x for memory and neuromorphic computing systems. It has been believed that polarization …

[HTML][HTML] Generation of super high frequencies by graphene on piezoelectric buffer layer upon applied nanosecond electrical pulse

O Kiprijanovič, E Park, JY Kwak, L Ardaravičius - AIP Advances, 2023 - pubs.aip.org
An unforeseen phenomenon occurred when measuring the current–voltage (I–U)
characteristics of graphene samples in the pulsed regime. The graphene monolayer of the …