Exploiting expendable process-margins in DRAMs for run-time performance optimization
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …
variations can affect a DRAM's performance severely. To counter these effects, DRAM …
A deep-submicron CMOS flow for general-purpose timing-detection insertion
This paper introduces a design independent extension to RTL-to-GDS design-flows for
seamless insertion of timing-detection flip-flops at critical paths of a digital CMOS standard …
seamless insertion of timing-detection flip-flops at critical paths of a digital CMOS standard …
Variations in Device Characteristics
Ever increasing variability in device characteristics is a major threat to the dependability,
since it could give rise to faults and failures in VLSI circuits and systems. The variability …
since it could give rise to faults and failures in VLSI circuits and systems. The variability …