Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices

F Roccaforte, P Fiorenza, G Greco, RL Nigro… - Microelectronic …, 2018 - Elsevier
Among the wide band gap (WBG) semiconductors, silicon carbide (4H-SiC) and gallium
nitride (GaN) are nowadays recognized as outstanding materials for the future of power …

Recent advances on dielectrics technology for SiC and GaN power devices

F Roccaforte, P Fiorenza, G Greco, M Vivona… - Applied Surface …, 2014 - Elsevier
Silicon carbide (SiC) and gallium nitride (GaN) devices are considered as optimal solutions
to meet the requirements of the modern power electronics. In fact, they can allow an …

Band offsets of high K gate oxides on III-V semiconductors

J Robertson, B Falabretti - Journal of applied physics, 2006 - pubs.aip.org
III-V semiconductors have high mobility and will be used in field effect transistors with the
appropriate gate dielectric. The dielectrics must have band offsets over 1 eV to inhibit …

Band offsets, Schottky barrier heights, and their effects on electronic devices

J Robertson - Journal of Vacuum Science & Technology A, 2013 - pubs.aip.org
The authors review the band line-ups and band offsets between semiconductors, dielectrics,
and metals, including the theory, experimental data, and the chemical trends. Band offsets …

Internal photoemission at interfaces of high-κ insulators with semiconductors and metals

VV Afanas'Ev, A Stesmans - Journal of applied physics, 2007 - pubs.aip.org
Internal photoemission spectroscopy provides the most straightforward way to characterize
the relative energies of electron states at interfaces of insulators with metals and …

Band offsets at semiconductor-oxide interfaces from hybrid density-functional calculations

A Alkauskas, P Broqvist, F Devynck, A Pasquarello - Physical review letters, 2008 - APS
Band offsets at semiconductor-oxide interfaces are determined through a scheme based on
hybrid density functionals, which incorporate a fraction α of Hartree-Fock exchange. For …

Silica on silicon carbide

V Presser, KG Nickel - Critical reviews in solid state and materials …, 2008 - Taylor & Francis
Silicon carbide (SiC) as both the most important non-oxide ceramic and promising
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …

Bonding at the Interface and the Effects of Nitrogen and Hydrogen

S Wang, S Dhar, S Wang, AC Ahyi, A Franceschetti… - Physical review …, 2007 - APS
Unlike the Si-SiO 2 interface, the SiC-SiO 2 interface has large defect densities. Though
nitridation has been shown to reduce the defect density, the effect of H remains an open …

Electrical performance of Al2O3 gate dielectric films deposited by atomic layer deposition on 4H-SiC

CM Tanner, YC Perng, C Frewin, SE Saddow… - Applied Physics …, 2007 - pubs.aip.org
Stoichiometric and pure Al 2 O 3 gate dielectric films were grown on n-type 4 H-Si C by a
thermal atomic layer deposition process. The electrical properties of both amorphous and …

The mechanism of defect creation and passivation at the SiC/SiO2 interface

P Deák, JM Knaup, T Hornos, C Thill… - Journal of Physics D …, 2007 - iopscience.iop.org
From the viewpoint of application in power electronics, SiC possesses the greatest
advantage of having SiO 2 as its native oxide. Unfortunately, the usual thermal oxidation …