Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices
Among the wide band gap (WBG) semiconductors, silicon carbide (4H-SiC) and gallium
nitride (GaN) are nowadays recognized as outstanding materials for the future of power …
nitride (GaN) are nowadays recognized as outstanding materials for the future of power …
Recent advances on dielectrics technology for SiC and GaN power devices
Silicon carbide (SiC) and gallium nitride (GaN) devices are considered as optimal solutions
to meet the requirements of the modern power electronics. In fact, they can allow an …
to meet the requirements of the modern power electronics. In fact, they can allow an …
Band offsets of high K gate oxides on III-V semiconductors
J Robertson, B Falabretti - Journal of applied physics, 2006 - pubs.aip.org
III-V semiconductors have high mobility and will be used in field effect transistors with the
appropriate gate dielectric. The dielectrics must have band offsets over 1 eV to inhibit …
appropriate gate dielectric. The dielectrics must have band offsets over 1 eV to inhibit …
Band offsets, Schottky barrier heights, and their effects on electronic devices
J Robertson - Journal of Vacuum Science & Technology A, 2013 - pubs.aip.org
The authors review the band line-ups and band offsets between semiconductors, dielectrics,
and metals, including the theory, experimental data, and the chemical trends. Band offsets …
and metals, including the theory, experimental data, and the chemical trends. Band offsets …
Internal photoemission at interfaces of high-κ insulators with semiconductors and metals
VV Afanas'Ev, A Stesmans - Journal of applied physics, 2007 - pubs.aip.org
Internal photoemission spectroscopy provides the most straightforward way to characterize
the relative energies of electron states at interfaces of insulators with metals and …
the relative energies of electron states at interfaces of insulators with metals and …
Band offsets at semiconductor-oxide interfaces from hybrid density-functional calculations
Band offsets at semiconductor-oxide interfaces are determined through a scheme based on
hybrid density functionals, which incorporate a fraction α of Hartree-Fock exchange. For …
hybrid density functionals, which incorporate a fraction α of Hartree-Fock exchange. For …
Silica on silicon carbide
Silicon carbide (SiC) as both the most important non-oxide ceramic and promising
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …
Bonding at the Interface and the Effects of Nitrogen and Hydrogen
Unlike the Si-SiO 2 interface, the SiC-SiO 2 interface has large defect densities. Though
nitridation has been shown to reduce the defect density, the effect of H remains an open …
nitridation has been shown to reduce the defect density, the effect of H remains an open …
Electrical performance of Al2O3 gate dielectric films deposited by atomic layer deposition on 4H-SiC
Stoichiometric and pure Al 2 O 3 gate dielectric films were grown on n-type 4 H-Si C by a
thermal atomic layer deposition process. The electrical properties of both amorphous and …
thermal atomic layer deposition process. The electrical properties of both amorphous and …
The mechanism of defect creation and passivation at the SiC/SiO2 interface
From the viewpoint of application in power electronics, SiC possesses the greatest
advantage of having SiO 2 as its native oxide. Unfortunately, the usual thermal oxidation …
advantage of having SiO 2 as its native oxide. Unfortunately, the usual thermal oxidation …