Failure mechanisms driven reliability models for power electronics: A review

OE Gabriel, DR Huitink - Journal of …, 2023 - asmedigitalcollection.asme.org
Miniaturization as well as manufacturing processes that electronics devices are subjected to
often results in to increase in operational parameters such as current density, temperature …

SPICE implementation of the dynamic memdiode model for bipolar resistive switching devices

FL Aguirre, J Suñé, E Miranda - Micromachines, 2022 - mdpi.com
This paper reports the fundamentals and the SPICE implementation of the Dynamic
Memdiode Model (DMM) for the conduction characteristics of bipolar-type resistive switching …

Simulation of bipolar-type resistive switching devices using a recursive approach to the dynamic memdiode model

E Miranda, E Piros, FL Aguirre, T Kim… - IEEE Electron …, 2023 - ieeexplore.ieee.org
Very often researchers in the field of resistive switching devices or memristors need to model
their experimental data using a compact representation without dealing with the …

Voltage-driven hysteresis model for resistive switching: SPICE modeling and circuit applications

GA Patterson, J Suñé, E Miranda - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Resistive switching devices are nonlinear electrical components that have drawn great
attention in the design of new technologies including memory devices and neuromorphic …

Effects of the voltage ramp rate on the conduction characteristics of HfO2-based resistive switching devices

H García, G Vinuesa, E García-Ochoa… - Journal of Physics D …, 2023 - iopscience.iop.org
Memristive devices have shown a great potential for non-volatile memory circuits and
neuromorphic computing. For both applications it is essential to know the physical …

Memristive state equation for bipolar resistive switching devices based on a dynamic balance model and its equivalent circuit representation

E Miranda, J Suñé - IEEE Transactions on Nanotechnology, 2020 - ieeexplore.ieee.org
A memory state equation consistent with a number of experimental observations is
presented and discussed within the framework of Chua's memristive systems theory. The …

Characterization of HfO2-based devices with indication of second order memristor effects

A Rodriguez-Fernandez, C Cagli, L Perniola… - Microelectronic …, 2018 - Elsevier
Resistive switching is investigated in TiN/Ti/HfO 2 (10 nm)/TiN devices in series with a
NMOS transistor as selector in a 1T1R configuration. A complete electrical characterization …

Switching Voltage and Time Statistics of Filamentary Conductive Paths in HfO2-Based ReRAM Devices

A Rodriguez-Fernandez, C Cagli… - IEEE Electron …, 2018 - ieeexplore.ieee.org
Switching voltage and time statistics of HfO 2-based one transistor-one resistor structures
are investigated with the aim of clarifying the underlying physical mechanism that governs …

Growth of amorphous, anatase and rutile phase TiO2 thin films on Pt/TiO2/SiO2/Si (SSTOP) substrate for resistive random access memory (ReRAM) device application

MA Alsaiari, NA Alhemiary, A Umar, BE Hayden - Ceramics International, 2020 - Elsevier
Memory structures play a basic role in providing integrated circuits of powerful processing
capabilities. Even most powerful processors have nothing to offer without an accompanying …

[HTML][HTML] A thorough investigation of the switching dynamics of TiN/Ti/10 nm-HfO2/W resistive memories

D Maldonado, G Vinuesa, S Aldana, FL Aguirre… - Materials Science in …, 2024 - Elsevier
The switching dynamics of TiN/Ti/HfO 2/W-based resistive memories is investigated. The
analysis consisted in the systematic application of voltage sweeps with different ramp rates …