The possibility of exploiting the analytical power of mass spectrometry to image the
chemistry of biological and similarly complex materials without the use of tags and with good …

Mass spectrometry imaging and profiling of individual cells and subcellular structures
provide unique analytical capabilities for biological and biomedical research, including …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an established technique for
the characterization of solid sample surfaces. The introduction of polyatomic ion beams …

Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …

The depth profiling of organic materials with argon cluster ion sputtering has recently
become widely available with several manufacturers of surface analytical instrumentation …

Time‐of‐flight secondary ion mass spectrometry (ToFSIMS) is being applied increasingly to
the study of biological systems where the chemical specificity of mass spectrometry and the …

Secondary ion mass spectrometry (SIMS) has become a powerful technique for the label-
free analysis of organics from cells to electronic devices. The development of cluster ion …

We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards)
interlaboratory study on the measurement of composition in organic depth profiling. Layered …

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) provides a method for the
detection of native and exogenous compounds in biological samples on a cellular scale …

ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight
into the three-dimensional (3D) chemical composition of a series of polymer multilayer …