Bias temperature instability and junction temperature measurement using electrical parameters in SiC power MOSFETs
JO Gonzalez, O Alatise - IEEE Transactions on Industry …, 2020 - ieeexplore.ieee.org
Junction temperature sensing is an integral part of both online and offline condition
monitoring where direct access to the bare die surface is not available. Given a defined …
monitoring where direct access to the bare die surface is not available. Given a defined …
Wear-Out Condition Monitoring of IGBT and mosfet Power Modules in Inverter Operation
F Gonzalez-Hernando, J San-Sebastian… - IEEE Transactions …, 2019 - ieeexplore.ieee.org
In this article, a condition monitoring system for the degradation assessment of power
semiconductor modules under switching conditions is presented. The proposed monitoring …
semiconductor modules under switching conditions is presented. The proposed monitoring …
Lifetime estimation of single crystal macro-fiber composite-based piezoelectric energy harvesters using accelerated life testing
Piezoelectric energy harvesters (PEHs) based on single crystal macro fiber composites
(SFCs) have been widely utilized in vibration sensing, energy conversion, and power …
(SFCs) have been widely utilized in vibration sensing, energy conversion, and power …
Challenges of junction temperature sensing in SiC power MOSFETs
JO Gonzalez, O Alatise - … on Power Electronics and ECCE Asia …, 2019 - ieeexplore.ieee.org
Junction temperature sensing is an integral part of both on-line and off-line condition
monitoring where direct access the bare die surface is not available. Given a defined power …
monitoring where direct access the bare die surface is not available. Given a defined power …
Real-Time Extraction of SiC mosfets' Degradation Features Under Improved Accelerated Power Cycling Tests for DC-SSPC Application
B Yu, L Wang - IEEE Transactions on Power Electronics, 2022 - ieeexplore.ieee.org
The SiC mosfet is a key component of the dc solid-state power controller (DC-SSPC). The
reliability of DC-SSPCs can be improved by real-time online monitoring of the degradation of …
reliability of DC-SSPCs can be improved by real-time online monitoring of the degradation of …
Monitoring of parameter stability of SiC MOSFETs in real application tests
M Sievers, B Findenig, M Glavanovics… - Microelectronics …, 2020 - Elsevier
Reliability testing of Si power semiconductors has had a long history and has resulted in a
good predictability of standard degradation-mechanism tests such as power cycling. To …
good predictability of standard degradation-mechanism tests such as power cycling. To …
Power and thermal cycling testbed for end of life assessment of semiconductor devices
The reliability of semiconductor power devices can be studied by performing a thermal and
power cycling test. In order to create the desired temperature cycles, there are four free …
power cycling test. In order to create the desired temperature cycles, there are four free …
Reliability Evaluation of Air Dryer Control Printed Circuit Board for Electric Multiple Unit by Accelerated Life Test
GH Kang, KS Kim, CY Chang, CS Kim - Journal of Electrical Engineering & …, 2024 - Springer
Compressed air is used for brake system of electric multiple units, and air dryers are
installed to prevent condensed water from being contained in the braking system. The …
installed to prevent condensed water from being contained in the braking system. The …
[PDF][PDF] Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy
H Du - 2020 - vbn.aau.dk
My appreciation goes to all my colleagues at the Department of Energy Technology, Aalborg
University, especially to Dr. Lorenzo Ceccarelli, Dr. Nick Baker, Mr. Yingzhou Peng, and Mr …
University, especially to Dr. Lorenzo Ceccarelli, Dr. Nick Baker, Mr. Yingzhou Peng, and Mr …
Reliability assessment in SiC and GaN power MOSFETs based emerging Wide Bandgap semiconductors technology from a systematic literature review
EA Guevara-Cabezas… - Dominio de las …, 2022 - dominiodelasciencias.com
Silicon power devices have improved over the last decades, but they are approaching their
per-formance limits imposed by material properties. However, emerging materials such as …
per-formance limits imposed by material properties. However, emerging materials such as …