[HTML][HTML] The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment

AB Renz, VA Shah, OJ Vavasour, Y Bonyadi… - Journal of Applied …, 2020 - pubs.aip.org
Molybdenum (Mo)/4H-silicon carbide (SiC) Schottky barrier diodes have been fabricated
with a phosphorus pentoxide (P 2 O 5⁠) surface passivation treatment performed on the SiC …

Trench Termination With SiO2-Encapsulated Dielectric for Near-Ideal Breakdown Voltage in 4H-SiC Devices

H Wang, J Wang, L Liu, Y Li, B Wang… - IEEE Electron …, 2018 - ieeexplore.ieee.org
Trench termination with SiO 2-encapsulated dielectric for 4H-SiC devices is proposed and
experimentally demonstrated. The trench is mainly refilled with spin-on dielectric which is …

Schottky barrier height inhomogeneity in 4H-SiC surface barrier detectors

J Osvald, L Hrubčín, B Zaťko - Applied Surface Science, 2020 - Elsevier
Schottky barrier height of the diodes prepared on Au/Ni/4H-SiC for surface barrier detectors
were studied by electrical methods of IV and CV measurements. Analysis of three …

Improved interface characteristics of Mo/4H-SiC schottky contact

K Chen, F Cao, Z Yang, X Li, J Yang, D Shi… - Solid-State Electronics, 2021 - Elsevier
In this work, we studied different proportions of Mo-C alloy Schottky contacts. Compare the
electrical characteristics and SiC interface with the Mo/4H-SiC based diodes. The Schottky …

Hybrid termination with wide trench for 4H-SiC super-junction devices

H Wang, C Wang, B Wang, H Long… - IEEE Electron Device …, 2020 - ieeexplore.ieee.org
Termination design for 4H-SiC super-junction devices based on “trench-etching and
implantation” technology, has been discussed through 3D numeric simulations and …

Laser-induced interfacial state changes enable tuning of the Schottky-barrier height in SiC

Z Lin, L Ji, Y Wu, L Hu, T Yan, Z Sun - Applied Surface Science, 2019 - Elsevier
We used a 193-nm ArF excimer laser to produce a surface functional layer with a tunable
Schottky barrier height (SBH) on the n-type 4H-SiC surface. The SBHs of the laser-modified …

Ideal Ni-based 4H–SiC Schottky barrier diodes with Si intercalation

M Gao, L Fan, Z Chen - Materials Science in Semiconductor Processing, 2020 - Elsevier
Abstract The Ni-based 4H–SiC Schottky barrier diodes (SBDs) with Si intercalation have
been investigated. The electrical properties of SBDs are characterized by temperature …

An investigation into the impact of surface passivation techniques using metal-semiconductor interfaces

Y Bonyadi, PM Gammon, YK Sharma… - Materials Science …, 2017 - Trans Tech Publ
Schottky barrier diodes (SBD) were fabricated on SiC surfaces that had been treated with
different surface passivation techniques, so that metal-semiconductor analysis could be …

Experimental study and characterization of an ultrahigh-voltage Ni/4H–SiC junction barrier Schottky rectifier with near ideal performances

X Deng, L Yang, Y Wen, X Li, F Yang, H Wu… - Superlattices and …, 2020 - Elsevier
An ultra-high voltage SiC JBS (silicon carbide junction barrier Schottky) rectifier utilizing a
novel area-efficient multi-zone gradient modulated field limiting ring (MGM-FLR) technique …

Effects of sacrificial oxidation on surface properties of n-and p-type 4H-SiC: implications for metal contact behaviors

L Huang, X Gu - Semiconductor Science and Technology, 2018 - iopscience.iop.org
A comparative investigation on the effects of sacrificial oxidation (SO) on the surface
properties of n-and p-type 4H-SiC has been conducted by using x-ray photoelectron …