[HTML][HTML] The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment
Molybdenum (Mo)/4H-silicon carbide (SiC) Schottky barrier diodes have been fabricated
with a phosphorus pentoxide (P 2 O 5) surface passivation treatment performed on the SiC …
with a phosphorus pentoxide (P 2 O 5) surface passivation treatment performed on the SiC …
Trench Termination With SiO2-Encapsulated Dielectric for Near-Ideal Breakdown Voltage in 4H-SiC Devices
Trench termination with SiO 2-encapsulated dielectric for 4H-SiC devices is proposed and
experimentally demonstrated. The trench is mainly refilled with spin-on dielectric which is …
experimentally demonstrated. The trench is mainly refilled with spin-on dielectric which is …
Schottky barrier height inhomogeneity in 4H-SiC surface barrier detectors
J Osvald, L Hrubčín, B Zaťko - Applied Surface Science, 2020 - Elsevier
Schottky barrier height of the diodes prepared on Au/Ni/4H-SiC for surface barrier detectors
were studied by electrical methods of IV and CV measurements. Analysis of three …
were studied by electrical methods of IV and CV measurements. Analysis of three …
Improved interface characteristics of Mo/4H-SiC schottky contact
K Chen, F Cao, Z Yang, X Li, J Yang, D Shi… - Solid-State Electronics, 2021 - Elsevier
In this work, we studied different proportions of Mo-C alloy Schottky contacts. Compare the
electrical characteristics and SiC interface with the Mo/4H-SiC based diodes. The Schottky …
electrical characteristics and SiC interface with the Mo/4H-SiC based diodes. The Schottky …
Hybrid termination with wide trench for 4H-SiC super-junction devices
Termination design for 4H-SiC super-junction devices based on “trench-etching and
implantation” technology, has been discussed through 3D numeric simulations and …
implantation” technology, has been discussed through 3D numeric simulations and …
Laser-induced interfacial state changes enable tuning of the Schottky-barrier height in SiC
Z Lin, L Ji, Y Wu, L Hu, T Yan, Z Sun - Applied Surface Science, 2019 - Elsevier
We used a 193-nm ArF excimer laser to produce a surface functional layer with a tunable
Schottky barrier height (SBH) on the n-type 4H-SiC surface. The SBHs of the laser-modified …
Schottky barrier height (SBH) on the n-type 4H-SiC surface. The SBHs of the laser-modified …
Ideal Ni-based 4H–SiC Schottky barrier diodes with Si intercalation
M Gao, L Fan, Z Chen - Materials Science in Semiconductor Processing, 2020 - Elsevier
Abstract The Ni-based 4H–SiC Schottky barrier diodes (SBDs) with Si intercalation have
been investigated. The electrical properties of SBDs are characterized by temperature …
been investigated. The electrical properties of SBDs are characterized by temperature …
An investigation into the impact of surface passivation techniques using metal-semiconductor interfaces
Y Bonyadi, PM Gammon, YK Sharma… - Materials Science …, 2017 - Trans Tech Publ
Schottky barrier diodes (SBD) were fabricated on SiC surfaces that had been treated with
different surface passivation techniques, so that metal-semiconductor analysis could be …
different surface passivation techniques, so that metal-semiconductor analysis could be …
Experimental study and characterization of an ultrahigh-voltage Ni/4H–SiC junction barrier Schottky rectifier with near ideal performances
X Deng, L Yang, Y Wen, X Li, F Yang, H Wu… - Superlattices and …, 2020 - Elsevier
An ultra-high voltage SiC JBS (silicon carbide junction barrier Schottky) rectifier utilizing a
novel area-efficient multi-zone gradient modulated field limiting ring (MGM-FLR) technique …
novel area-efficient multi-zone gradient modulated field limiting ring (MGM-FLR) technique …
Effects of sacrificial oxidation on surface properties of n-and p-type 4H-SiC: implications for metal contact behaviors
L Huang, X Gu - Semiconductor Science and Technology, 2018 - iopscience.iop.org
A comparative investigation on the effects of sacrificial oxidation (SO) on the surface
properties of n-and p-type 4H-SiC has been conducted by using x-ray photoelectron …
properties of n-and p-type 4H-SiC has been conducted by using x-ray photoelectron …