Radiofrequency (RF) probes based on 50-planar transmission lines play a key role in almost
every stage of RF device development, establishing the physical contact between high-end …

Sub-mm circuit design requires accurate on-wafer characterization of passive and active
devices. In industry, characterization of these devices is often performed with off-wafer short …

We present a novel non-contact metrology approach for on-wafer characterization of sub-
millimeter-wave devices, components, and integrated circuits. Unlike existing contact probes …

In this article, we present a new type of waveguide ground-signal-ground (GSG) probe for
millimeter-wave (mmWave) on-wafer measurements. The proposed design integrates a …

This paper introduces a novel free-space terahertz (THz) characterization setup featuring an
electronic-based technique and miniature additive-manufactured hemispherical lens …

This article presents a state-of-art review of on-wafer S-parameter characterization of THz
silicon transistors for compact modelling purpose. After, a brief review of calibration/de …

As the maximum frequency of electronics is rising, on-wafer measurements play an
important role in modeling of integrated devices. Most of the time, due to the lack of …

The impact of tilt-related errors on the positioning of microcantilever-based
microelectromechanical systems (MEMS) on-wafer electrical probes, having multiple contact …

This paper introduces an improved method for monitoring and controlling the contact
condition of terahertz on-wafer probes to enhance the measurement repeatability as well as …

Differential circuits are commonly used for millimeter-wave monolithic integrated circuits
such as amplifiers and voltage-controlled oscillators. The infrastructure for their …