X-ray backscatter imaging of an object embedded in a highly scattering medium
K Safinya, A Voll, A Sofiienko, D Ponce… - US Patent …, 2019 - Google Patents
An apparatus and associated method for obtaining a three dimensional representation of a
target object within a fluid carrying conduit, such as a hydrocarbon exploration or production …
target object within a fluid carrying conduit, such as a hydrocarbon exploration or production …
Inspection system of wellbores and surrounding rock using penetrating X-rays
TK Kroc, R Kephart - US Patent 11,719,852, 2023 - Google Patents
A system, method, and apparatus for wellbore inspection comprise an electron accelerator
to generate X-rays, a rotating collimator assembly configured to produce a cone of X-rays …
to generate X-rays, a rotating collimator assembly configured to produce a cone of X-rays …
High-energy X-ray source and detector for wellbore inspection
TK Kroc, R Kephart - US Patent 11,054,544, 2021 - Google Patents
A system, method, and apparatus for wellbore inspection comprise an electron accelerator
to generate X-rays, a rotating collimator assembly configured to produce a cone of X-rays …
to generate X-rays, a rotating collimator assembly configured to produce a cone of X-rays …
Certified wafer inspection
SRP Pavani - US Patent 9,324,541, 2016 - Google Patents
BACKGROUND Wafer inspection refers to inspecting semiconductor wafers for defects or
abnormalities located on the surface of the wafer. Finding such defects is important for …
abnormalities located on the surface of the wafer. Finding such defects is important for …