[PDF][PDF] Imaging with mass spectrometry

ML Pacholski, N Winograd - Chemical reviews, 1999 - academia.edu
Imaging mass spectrometry (MS) has created new fundamental research opportunities in
many fields because of its unique ability to acquire molecule-and element-specific pictures …

[图书][B] Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)

D Stokes - 2008 - books.google.com
Offers a simple starting point to VPSEM, especially for new users, technicians and students
containing clear, concise explanations Crucially, the principles and applications outlined in …

Secondary electron contrast in low-vacuum∕ environmental scanning electron microscopy of dielectrics

BL Thiel, M Toth - Journal of applied physics, 2005 - pubs.aip.org
Low vacuum scanning electron microscopy (SEM) is a high-resolution technique, with the
ability to obtain secondary electron images of uncoated, nonconductive specimens. This feat …

Variable Pressure Electron Beam Lithography (VP-eBL):  A New Tool for Direct Patterning of Nanometer-Scale Features on Substrates with Low Electrical …

BD Myers, VP Dravid - Nano letters, 2006 - ACS Publications
We introduce variable pressure electron beam lithography (VP-e BL), as a new approach for
the fabrication of nanometer-scale structures on electrically insulating substrates. This novel …

The scanning electron microscope

AE Vladár, MT Postek - Handbook of Charged Particle Optics, 2017 - taylorfrancis.com
The scanning electron microscope (SEM) is extensively used in many fields of research and
industrial production throughout the world. The SEM provides higher spatial resolution …

Electron scattering cross-section measurements in ESEM

GD Danilatos - Micron, 2013 - Elsevier
A review, analysis and discussion on the derivation and measurement of electron scattering
cross-sections of gases mostly used in environmental scanning electron microscopy is …

The study of water in heterogeneous media using environmental scanning electron microscopy

BL Thiel, AM Donald - Journal of molecular liquids, 1999 - Elsevier
The Environmental scannning electron microscope has opened the door to examining a
whole new range of water-and other liquid-containing specimens at unprecedented …

Electron scattering cross section measurements in a variable pressure scanning electron microscope

SA Wight, AR Konicek - Micron, 2012 - Elsevier
Scattering of the incident electron beam in the variable pressure scanning electron
microscope (VPSEM) affects the ability to perform quantitative chemical measurements …

Charge neutralization in the ESEM for quantitative X-ray microanalysis

RA Carlton, CE Lyman… - Microscopy and …, 2004 - academic.oup.com
Quantitative chemical analysis by energy-dispersive X-ray spectrometry (EDS) in the
environmental scanning electron microscope (ESEM) is difficult. This analysis is complicated …

Potentials for high pressure/environmental SEM microscopy for photomask dimensional metrology

MT Postek, AE Vladar, TM Rice… - … Inspection, and Process …, 2003 - spiedigitallibrary.org
Binary and phase-shifting chromium on quartz optical photomasks have been successfully
investigated with high-pressure/environmental scanning electron microscopy. The …