InGaN: An overview of the growth kinetics, physical properties and emission mechanisms

FK Yam, Z Hassan - Superlattices and Microstructures, 2008 - Elsevier
This article reviews the fundamental properties of InGaN materials. The growth kinetics
associated with the growth parameters, such as growth temperatures, V/III ratios, and growth …

Structure and electronic properties of InN and In-rich group III-nitride alloys

W Walukiewicz, JW Ager, KM Yu… - Journal of Physics D …, 2006 - iopscience.iop.org
The experimental study of InN and In-rich InGaN by a number of structural, optical and
electrical methods is reviewed. Recent advances in thin film growth have produced single …

Photoluminescence and intrinsic properties of MBE-grown InN nanowires

T Stoica, RJ Meijers, R Calarco, T Richter, E Sutter… - Nano …, 2006 - ACS Publications
The influence of the growth parameters on the photoluminescence (PL) spectra has been
investigated for samples with columnar morphology, either with InN columns on original …

Band-gap measurements of direct and indirect semiconductors using monochromated electrons

L Gu, V Srot, W Sigle, C Koch, P van Aken… - Physical Review B …, 2007 - APS
With the development of monochromators for transmission electron microscopes, valence
electron-energy-loss spectroscopy (VEELS) has become a powerful technique to study the …

The impact of surface and retardation losses on valence electron energy-loss spectroscopy

R Erni, ND Browning - Ultramicroscopy, 2008 - Elsevier
The inelastic scattering of fast electrons transmitting thin foils of silicon (Si), silicon nitride
(Si3N4), gallium arsenide (GaAs), gallium nitride (GaN) and cadmium selenide (CdSe) was …

Structural, optical and morphological properties of hybrid heterostructures on the basis of GaN grown on compliant substrate por-Si (111)

PV Seredin, AS Lenshin, AM Mizerov, H Leiste… - Applied Surface …, 2019 - Elsevier
Structural, optical and morphological properties of hybrid heterostructures on the basis of
GaN grown on compliant substrate por-Si(111) - ScienceDirect Skip to main contentSkip to …

Thickness-dependent band gap of α-In2Se3: from electron energy loss spectroscopy to density functional theory calculations

F Lyu, Y Sun, Q Yang, B Tang, M Li, Z Li, M Sun… - …, 2020 - iopscience.iop.org
Abstract α-In 2 Se 3 has attracted increasing attention in recent years due to its excellent
electrical and optical properties. Especially, attention has been paid to its peculiar …

Quantification of the size-dependent energy gap of individual CdSe quantum dots by valence electron energy-loss spectroscopy

R Erni, ND Browning - Ultramicroscopy, 2007 - Elsevier
Valence electron energy-loss spectroscopy (VEELS) performed in a monochromated
scanning transmission electron microscope was used to measure the energy gaps of …

2 Electron Bandstructure Parameters Igor Vurgaftman and Jerry R. Meyer

I Vurgaftman - Nitride semiconductor devices: Principles and …, 2007 - books.google.com
In response to the current intensive scientific and commercial interest in nitride
semiconductors, several recent works have reviewed their material and physical properties …

Influence of por-Si sublayer on the features of heteroepitaxial growth and physical properties of InxGa1-xN/Si (111) heterostructures with nanocolumn morphology of …

PV Seredin, DL Goloshchapov, АS Lenshin… - Physica E: Low …, 2018 - Elsevier
Integrated heterostructures with a nanocolumn morphology of the film In x Ga 1-x N were
grown using the method of molecular beam epitaxy, with plasm activation of nitrogen on a …