Precision X-ray methods for absolute and relative determination of crystal lattice parameters
(interplanar distances) are described and compared, including the X-ray divergent-beam …

Описываются и сравниваются прецизионные рентгеновские методы абсолютного и
относительного определения параметров кристаллической решётки (межплоскостных …

X-ray diffraction topography is one of basic diagnostics tools serving for visualisation of
single crystal lattice defects. Defects of various kinds can be observed. The present study is …

In this paper, we present theoretical investigations on mechanical and ultrasonic properties
of Si/Si x Ge1− x nanowires. Anharmonic elastic constants of the material are calculated at …

Kontrola obecności i sposoby regulacji różnych mikrodefektów, które wywołują lokalne
zaburzenie w periodyczności sieci, jest niezwykle trudna zarówno z naukowego punktu …

Si: Ge crystals with approximately 3% of germanium were studied with various topographic
methods using both conventional and synchrotron sources of X-rays. The present …