An efficient radiation hardening SRAM cell to mitigate single and double node upset soft errors
Various charged particles in space, including α-particles, neutrons, heavy ions, and photons,
create stability and reliability concerns in memory circuits. Furthermore, these particles …
create stability and reliability concerns in memory circuits. Furthermore, these particles …
A robust radiation resistant SRAM cell for space and military applications
Many charged particles in space, including α-particles, neutrons, heavy ions, electrons, and
photons, wreak havoc on the stability and reliability of memory circuits. In addition, these …
photons, wreak havoc on the stability and reliability of memory circuits. In addition, these …
[HTML][HTML] A soft error upset hardened 12T-SRAM cell for space and terrestrial applications
Various charged particles in space, including alpha particles, neutrons, heavy ions, and
photons, pose reliability and stability concerns for memory circuits. These particles also …
photons, pose reliability and stability concerns for memory circuits. These particles also …
[HTML][HTML] Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications
JY Oh, SH Jo - Applied Sciences, 2024 - mdpi.com
The critical charge of sensitive nodes decreases as transistors scale down with the
advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the …
advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the …
Investigating and Improving the Performance of Radiation-Hardened SRAM Cell with the Use of Multi-Voltage Transistors
R Ahirwar, M Pattanaik, P Srivastava - Journal of Electronic Testing, 2024 - Springer
This research introduces a proposed energy-efficient radiation-hardened and improved read
stability (RHIRS)-12T SRAM cell with a polarity hardening technique, which lowers the …
stability (RHIRS)-12T SRAM cell with a polarity hardening technique, which lowers the …
A 14T Radiation Resistant Self-Recoverable SRAM Cell
Space radiation malfunctions electric circuits are particularly vulnerable to memory device's
sensitive storage nodes and disrupts stored data. Standard 6T SRAM cannot mitigate this …
sensitive storage nodes and disrupts stored data. Standard 6T SRAM cannot mitigate this …
Enhanced Critical Charge (Q cr) and Highly Reliable Read-Decoupled Radiation-Hardened 14T SRAM cell for Aerospace Application
R Ahirwar, M Pattanaik, P Srivastava - 2023 - researchsquare.com
Due to technological advancements, the size of transistors and the spacing between them is
decreasing, resulting in a reduction in the critical charge of sensitive nodes. This decrease in …
decreasing, resulting in a reduction in the critical charge of sensitive nodes. This decrease in …
[PDF][PDF] Memories-Materials, Devices, Circuits and Systems
Various charged particles in space, including alpha particles, neutrons, heavy ions, and
photons, pose reliability and stability concerns for memory circuits. These particles also …
photons, pose reliability and stability concerns for memory circuits. These particles also …