[HTML][HTML] Reliability and interpretation of the microstructural parameters determined by X-ray line profile analysis for nanostructured materials
J Gubicza - The European Physical Journal Special Topics, 2022 - Springer
In this overview, the applicability of X-ray diffraction line profile analysis (XLPA) for the
characterization of the microstructure in nanostructured materials is overviewed. The …
characterization of the microstructure in nanostructured materials is overviewed. The …
Effect of sintering temperature in argon atmosphere on microstructure and properties of 3D printed alumina ceramic cores
Alumina ceramics with different sintering temperatures in argon atmosphere were obtained
using stereolithography-based 3D printing. The effects of sintering temperature on …
using stereolithography-based 3D printing. The effects of sintering temperature on …
One-dimensional carbon/SiC nanocomposites with tunable dielectric and broadband electromagnetic wave absorption properties
P Wang, L Cheng, L Zhang - Carbon, 2017 - Elsevier
In this work, 1D carbon/SiC nanocomposites were fabricated by the electrospinning of
polycarbosilane (PCS) and polyvinylpyrrolidone (PVP) with subsequent polymer pyrolysis …
polycarbosilane (PCS) and polyvinylpyrrolidone (PVP) with subsequent polymer pyrolysis …
Effects of solution treatment on tensile properties and strengthening mechanisms of SiCp/6061Al composites fabricated by powder thixoforming
XZ Zhang, TJ Chen, YH Qin - Materials & Design, 2016 - Elsevier
Abstract 6061 Al-based composites reinforced with 10% volume fractions of 6.94 μm SiC
particles (SiC p) have been fabricated by powder thixoforming, and the effects of solution …
particles (SiC p) have been fabricated by powder thixoforming, and the effects of solution …
Polycrystalline diamond compact with enhanced thermal stability
S Liu, L Han, Y Zou, P Zhu, B Liu - Journal of materials science & …, 2017 - Elsevier
Polycrystalline diamond compacts (PDC), which are composed of diamond and WC/Co
substrate, and synthesized at high pressure and high temperature (HPHT), are widely …
substrate, and synthesized at high pressure and high temperature (HPHT), are widely …
Nanocrystalline cubic silicon carbide: A route to superhardness
Superhard materials other than diamond and cubic boron nitride have been actively
pursued in the past two decades. Cubic silicon carbide, ie, β‐SiC, is a well‐known hard …
pursued in the past two decades. Cubic silicon carbide, ie, β‐SiC, is a well‐known hard …
Processing of nano-SiC ceramics: densification by SPS and mechanical characterization
F Lomello, G Bonnefont, Y Leconte… - Journal of the European …, 2012 - Elsevier
β-SiC nanopowders with a mean particle size of 16.6 nm were obtained by laser pyrolysis.
De-agglomeration of the powder was performed in an aqueous medium under magnetic …
De-agglomeration of the powder was performed in an aqueous medium under magnetic …
[PDF][PDF] Characterizing dislocation loops in irradiated polycrystalline Zr alloys by X-ray line profile analysis of powder diffraction patterns with satellites
This work extends the convolutional multiple whole profile (CMWP) line profile analysis
(LPA) procedure to determine the total dislocation density and character of irradiation …
(LPA) procedure to determine the total dislocation density and character of irradiation …
Defect-related physical-profile-based X-ray and neutron line profile analysis
Diffraction line broadening is caused by different defects present in crystalline materials:(1)
small coherent domains,(2) dislocations,(3) other types of microstrains,(4) twin …
small coherent domains,(2) dislocations,(3) other types of microstrains,(4) twin …
Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis
X-ray line profile analysis is a powerful alternative tool for determining dislocation densities,
dislocation type, crystallite and subgrain size and size-distributions, and planar defects …
dislocation type, crystallite and subgrain size and size-distributions, and planar defects …